tag: 16nm FinFET

Variation In Low-Power FinFET Designs

By Ann Mutschler - 30 Aug, 2018 - Comments: 1

One of the biggest advantages of moving to the a leading edge process node is ultra-low voltage operation, where devices can achieve better performance using less power. But the latest generation process nodes also introduce a number of new challenges due to increased variation that can affect everything from signal integrity to manufacturing yield. While variation is generally well understo... » read more

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