tag: atomic force microscopy

A Deionized Water-Based Large-Scale Transfer Process For 2D Materials Grown on Sapphire (AMO, RWTH, Aixtron)
By Technical Paper Link - 18 May, 2026 - Comments: 0

A new technical paper, "Water-based, large-scale transfer of 2D materials grown on sapphire substrates," was published by researchers at AMO GmbH, RWTH Aachen University, and AIXTRON SE. Abstract "Two-dimensional materials (2DMs) hold significant potential for future electronics, as demonstrated by high-performing devices for sensing, optics, and electronics. However, scalable growth tech... » read more

Surface Metrology for Hybrid Bonding in Advanced Semiconductor Packaging
By Bruker - 13 Jan, 2026 - Comments: 0

Achieving a reliable hybrid bond requires both surfaces to be pristine. To support this requirement, metrology methods such as atomic force microscopy (AFM) and atomic force profilometry (AFP) are critical for surface characterization and process optimization. AFM delivers localized, high-resolution surface measurements, while AFP provides complementary large-area topography scans that ... » read more

Research Bits: Jan. 12
By Jesse Allen - 12 Jan, 2026 - Comments: 0

Wafer-scale two-photon lithography Researchers from Lawrence Livermore National Laboratory (LLNL) and Stanford University demonstrated a two-photon lithography (TPL) platform for wafer-scale manufacturing. The TPL platform uses large arrays of metalenses to split a femtosecond laser into more than 120,000 coordinated focal spots that write simultaneously across centimeter-scale areas. The a... » read more

Thermal Scanning-Probe Lithography in vdW Heterostructures (Technical University of Denmark)
By Technical Paper Link - 06 Jan, 2026 - Comments: 0

A new technical paper titled "Gradient Electronic Landscapes in van der Waals Heterostructures" was published by researchers at Technical University of Denmark. Abstract Excerpt "Here, we use thermal scanning-probe lithography to produce smooth topographic landscapes in vdW heterostructures by patterning the thickness of the top hBN flake with nanometer precision." Find the technical p... » read more

AFM-Based Protocol for Characterizing the Incipient Stages of Plasticity on Hybrid Bonding-Ready Copper Pads (NIST, Intel, Colorado School of Mines)
By Technical Paper Link - 23 Dec, 2025 - Comments: 0

A new technical paper titled "Probing the Nanoscale Onset of Plasticity in Electroplated Copper for Hybrid Bonding Structures via Multimodal Atomic Force Microscopy" was published by researchers at the National Institute of Standards and Technology, Intel, and Colorado School of Mines. Excerpt  "The slowdown of Moore’s law has elicited a paradigm shift whereby shrinking of in-plane dim... » read more

Epitaxial Growth Of Up To 120 Si/SiGe Bilayers In View of 3D DRAM Applications (imec, Ghent Univ.)
By Technical Paper Link - 05 Aug, 2025 - Comments: 0

A new technical paper titled "Epitaxial growth of up to 120× {Si0.8Ge0.2/Si} bilayers in view of three dimensional dynamic random access memory applications" was published by researchers at imec and Ghent University. Abstract "Epitaxially grown Si/Si1−xGex multi-stacks with ≥100 bilayers (≥200 sublayers) are being considered for three dimensionally vertically stacked dynamic rando... » read more

Atomic Force Microscopy: The Definitive AFM Modes Handbook
By Bruker - 08 May, 2025 - Comments: 0

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken into seven separate categories: morphology, electromagnetic properties, thermal properties, mechanical properties, chemical properties, electrochemical properties, and manipulation. Each category be... » read more

Relative Humidity in Conductive Atomic Force Microscopy (KAUST)
By Technical Paper Link - 11 Sep, 2024 - Comments: 0

A new technical paper titled "The Effect of Relative Humidity in Conductive Atomic Force Microscopy" was published by researchers at KAUST. Abstract "Conductive atomic force microscopy (CAFM) analyzes electronic phenomena in materials and devices with nanoscale lateral resolution, and it is widely used by companies, research institutions, and universities. Most data published in the field o... » read more

Steps to Fabricate Nanotips Overhanging From Chip Edge By a Few Micrometers (CNRS, CEA-Leti)
By Technical Paper Link - 10 Sep, 2024 - Comments: 0

A new technical paper titled "Suspended tip overhanging from chip edge for atomic force microscopy with an optomechanical resonator" was published by researchers at Lab. d'Analyse et d'Architecture des Systèmes du CNRS and CEA-LETI. Abstract Raising the mechanical frequency of atomic force microscopy (AFM) probes to increase the measurement bandwidth has been a long-standing expectation in... » read more

Finely Tuning The Electronic Band Structure of WSe2 With AFM
By Technical Paper Link - 08 Jul, 2024 - Comments: 0

A technical paper titled “Strain Driven Electrical Bandgap Tuning of Atomically Thin WSe2” was published by researchers at University of Toronto, University of Tokyo,  and Stanford University. Abstract: "Tuning electrical properties of 2D materials through mechanical strain has predominantly focused on n-type 2D materials like MoS2 and WS2, while p-type 2D materials such as WSe2 remain... » read more

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