tag: Synopsys

Low Power Meets Variability At 7/5nm
By Ann Mutschler - 11 Apr, 2019 - Comments: 0

Power-related issues are beginning to clash with process variation at 7/5nm, making timing closure more difficult and resulting in re-spins caused by unexpected errors and poor functional yield. Variability is becoming particularly troublesome at advanced nodes, and there are multiple causes of that variability. One of the key ones is the manufacturing process, which can be affected by every... » read more

Accelerating Physical Verification Productivity for Advanced Node Designs with IC Validator
By Synopsys - 10 Apr, 2019 - Comments: 0

Applications such as deep-learning, autonomous driving vehicles, and mobility on 5G networks fuel the need for continuous advancements in IC integration. Growing design complexity, pressure on design cycle time, process advancements and increasing verification requirements are driving the need for faster, more efficient physical verification flows. The current state-of-the-art FinFET processes ... » read more

From AI Algorithm To Implementation
By Brian Bailey - 10 Apr, 2019 - Comments: 0

Semiconductor Engineering sat down to discuss the role that EDA has in automating artificial intelligence and machine learning with Doug Letcher, president and CEO of Metrics; Daniel Hansson, CEO of Verifyter; Harry Foster, chief scientist verification for Mentor, a Siemens Business; Larry Melling, product management director for Cadence; Manish Pandey, Synopsys fellow; and Raik Brinkmann, CEO ... » read more

Blog Review: April 10
By Jesse Allen - 10 Apr, 2019 - Comments: 0

Arm's Paul Whatmough discusses the growing use of real-time computer vision on mobile devices and proposes transfer learning as a way to enable neural network workloads on resource-constrained hardware. Cadence's Anton Klotz highlights a collaboration with Imec and TU Eindhoven on cell-aware test that reduces defect simulation time by filtering out defects with equivalent fault effects. M... » read more

New Approaches To Security
By Ed Sperling - 09 Apr, 2019 - Comments: 0

Different approaches are emerging to identify suspicious behavior and shut down potential breaches before they have a chance to do serious damage. This is becoming particularly important in markets where safety is an issue, and in AI and edge devices where the rapid movement of data is essential. These methods are a significant departure from the traditional way of securing devices through l... » read more

Spreading Intelligence From The Cloud To The Edge
By Kevin Fogarty and Ed Sperling - 04 Apr, 2019 - Comments: 0

The challenge of partitioning processing between the edge and the cloud is beginning to come into focus as chipmakers and systems companies wrestle with a massive and rapidly growing volume of data. There are widely different assessments of how much data this ultimately will include, but everyone agrees it is a very large number. Petabytes are simply rounding errors in this equation, and tha... » read more

Combining SLAM And CNN For High-Performance Augmented Reality
By Gordon Cooper - 04 Apr, 2019 - Comments: 0

Robotics and headsets or goggles are the most common hardware devices requiring AR/VR/mixed reality, and AR is coming to mobile phones, tablets, and automobiles as well. For hardware devices to see the world around them and add to that reality with inserted graphics or images, they need to determine their position in space and map the surrounding environment. Simultaneous localization and ma... » read more

The Long And Detailed Road To Automotive Compliance
By Ann Mutschler - 04 Apr, 2019 - Comments: 0

Compliance with automotive safety requirements is slowing down both innovation and participation by a flurry of startups as the whole ecosystem struggles to bring autonomous vehicles to reality. This is particularly onerous for chipmakers, which face a high bar for IC integrity and reliability. They must meet specifications and be free of design errors. Improper behavior in corner-case s... » read more

Redefining Expectations For Test
By Synopsys - 03 Apr, 2019 - Comments: 0

New and rapidly expanding applications, such as artificial intelligence and automotive, are increasing in design size and complexity. These evolving market segments require unprecedented levels of quality and long-term reliability, which has created a fundamental shift in both the importance and need for integration of advanced semiconductor test. Synopsys unveiled a new family of test products... » read more

Blog Review: April 3
By Jesse Allen - 03 Apr, 2019 - Comments: 0

Synopsys' Taylor Armerding contends that as the IoT becomes more ubiquitous, the threat of cyber-physical attacks is rising, with the potential for a domino effect if even simple devices are compromised in large enough quantities. Mentor's Colin Walls considers the move away from programming on bare metal with the rise of drivers and RTOSes and when it makes sense to still use the old method... » read more

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