tag: Synopsys

Inflection Points Ahead
By Ed Sperling - 23 Aug, 2012 - Comments: 0

By Ed Sperling Engineering challenges have existed at every process node in semiconductor designs, but at 20nm and beyond, engineers and executives on all sides of the industry are talking about inflection points. An inflection point is literally the place where a curve on a graph turns down or up, but in the semiconductor industry it’s usually associated with the point at which a progres... » read more

Dealing With Test More Effectively
By Ed Sperling - 23 Aug, 2012 - Comments: 0

By Ed Sperling Shrinking geometries are starting to have the same effect on test as they are on other parts of an SoC, with the focus shifting from area to leakage, heat, noise, signal integrity, and the impact on overall system performance. The warning that design teams have to consider test much earlier in the design was issued to chipmakers years ago and largely ignored. At 28nm that war... » read more

Best Practices In Verification
By Ed Sperling - 23 Aug, 2012 - Comments: 0

By Ann Steffora Mutschler The advent of advanced verification methodologies such as the UVM and its predecessors VMM and OVM has changed the verification landscape in many ways. Design and verification teams used to worry about simulator performance (i.e., how fast the simulator runs a particular test case), but the introduction of constrained-random stimulus and functional coverage and associ... » read more

Being Different Is Bad
By Ed Sperling - 23 Aug, 2012 - Comments: 0

By Ann Steffora Mutschler Today’s SoCs contain as much as 80% existing IP that either has been re-used from previous projects or obtained from a third party. Models are created of this hardware IP, as well as new portions of the design, in order to create a virtual prototype that allows the engineering team to see the complete system by running software and applications. While this a... » read more

ROM Code First
By Achim Nohl - 23 Aug, 2012 - Comments: 0

By Achim Nohl Finally, nine months after the next-generation SoC project was kicked off, the first prototype board has finally arrived! There are just six months left to get Android and Linux up and running. Because Android should take full advantage of the latest hardware additions, let’s make sure we get it ported as quickly as possible. Unfortunately, it’s not that easy. Before you c... » read more

Who Owns What And Why
By Ed Sperling - 23 Aug, 2012 - Comments: 0

Who’s calling the shots these days—and how long they’ll continue calling the shots—is turning out to be as much conjecture as playing the futures exchange. There are so many changes underway that even engineers are crossing boundaries no one ever expected and ending up in companies outside of IC design or moving from seemingly far afield into the design world. Still, there are some c... » read more

Mixed-Signal IP Design Challenges In 28nm Process And Beyond
By Various Writers - 23 Aug, 2012 - Comments: 0

As process technologies continue to scale aggressively, it is becoming more challenging when developing high-quality, high-speed mixed-signal IP. Specifically, the 28-nm process poses some unique challenges not found in 65-nm and 40-nm technology processes. This paper discusses the low power requirements found in 28-nm processes and addresses issues associated with the aggressive scaling of ... » read more

Experts At The Table: Stacked Die Reality Check
By Ed Sperling - 16 Aug, 2012 - Comments: 0

By Ed Sperling Semiconductor Manufacturing & Design sat down with Sunil Patel, principal member of the technical staff for package technology at GlobalFoundries; Steve Pateras, product marketing director at Mentor Graphics; Steve Smith, senior director of platform marketing at Synopsys; Thorsten Matthias, business development director at EVGroup; and Manish Ranjan, vice president of market... » read more

Analog Hits The Power Wall
By Ed Sperling - 09 Aug, 2012 - Comments: 0

By Ed Sperling Analog design teams are starting to encounter the same physical issues that digital design engineers began wrestling with several nodes ago—only the problems are more complicated and even more difficult to solve. At advanced nodes digital circuitry is susceptible to an array of physical effects ranging from heat, electromigration, electromagnetic interference and electrosta... » read more

Mining For Data
By Ed Sperling - 09 Aug, 2012 - Comments: 0

By Ann Steffora Mutschler Power analysis accuracy at the RTL design abstraction is a challenging problem. Smaller geometries just make the challenge of predicting accurate RTL power consumption even more difficult, which in turn impacts other design decisions such as power-grid planning and package selection. “It’s one of these things where the earlier you are in the design, even befo... » read more

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