High-Speed Manufacturing And In-Field Scan Test Access Via PCI Express For GPIO Limited SoCs


By Ash Patel and Shubharthi Datta, Synopsys, and Chuanyun Fan, Cisco Today’s huge, deep submicron system on chip (SoC) designs present many challenges at every stage of development, from architectural exploration to volume production. This post addresses the specific hurdle of effective and efficient manufacturing tests for these complex devices. It outlines a commercially available soluti... » read more

Test Anything, Anywhere, Anytime


The semiconductor industry is under relentless pressure to deliver devices that are not only high-performing but also exceptionally reliable across their entire lifecycle. From the moment a chip is tested at the wafer to its deployment in complex systems such as data centers and automotive platforms, the expectation is clear: zero-defect quality at shipment and continuous reliability in the fie... » read more