Comparative Analysis of CFET and NSFET Architectures (TU Munich, IIT)


A new technical paper titled "Impact of Aging, Self-Heating, and Parasitics Effects on NSFET and CFET" was published by researchers at TU Munich and Indian Institute of Technology. Abstract "This work presents a comparative analysis of complementary field-effect transistor (CFET) and nanosheet FET (NSFET) architectures, with a focus on self-heating effects (SHEs), negative bias temperature ... » read more

Dealing With Device Aging At Advanced Nodes


Premature aging of circuits is becoming troublesome at advanced nodes, where it increasingly is complicated by new market demands, more stress from heat, and tighter tolerances due to increased density and thinner dielectrics. In the past, aging and stress largely were separate challenges. Those lines are starting to blur for a number of reasons. Among them: In automotive, advanced-node... » read more