Are All Known Good Tested Devices Created Equal?


Your known good parts all had passed their required wafer sort, final test, and system-level tests and were shipped to your customers. However, as we all know, a known good part or device sometimes does not stay good and may end up failing prematurely in the field and flagged as an RMA (return material authorization) by your customer. But why is it that some good parts fail early and others las... » read more

Outlier Detection


With increasing focus on quality and reliability across all segments beyond just automotive, medical and mil-aero, it is more critical than ever for companies to leverage every byte of test data at their disposal to ensure that they deliver the lowest possible DPPM (defective parts per million) rates to their customers. Semiconductor manufacturing operations now generate up to 100TB of test ... » read more