Finding Defects In IC Packages


Several equipment makers are ramping up new inspection equipment to address the growing defect challenges in IC packaging. At one time, finding defects in packaging was relatively straightforward. But as packaging becomes more complex, and as it is used in markets where reliability is critical, finding defects is both more difficult and more important. This has prompted the development of a ... » read more

Failure Analysis Of Electronic Devices Using Scanning Acoustic Microscopy


Scanning acoustic microscopy, or SAM, is a non-destructive technique used in failure analysis of complex devices. SAM can provide a resolution down to sub-micron thicknesses. SAM is an efficient tool for analysis of adhesion between layers and presence of possible flaws in each layer. This can be used e.g. for investigations of sealing, coating, flip-chip underfills, BGA, QFN, wafer to wafer ... » read more

The Week in Review: IoT


Finance Cincinnati-based Losant, which offers an enterprise Internet of Things platform, reports raising $5.2 million in Series A funding led by CincyTech. The Rise of the Rest Seed Fund, TechNexus, and Vine Street Ventures also participated in the new round. Losant says customers for its scalable IoT platform include Bosch, Hewlett Packard Enterprise, and Verizon Communications. SAM of Tel... » read more