tag: stacked die

HBM Leads The Way To Defect-Free Bumps
By Laura Peters - 11 Nov, 2025 - Comments: 0

High-bandwidth memory stands at the forefront of multiple technology developments as a critical enabler of AI, but it is one of the most difficult modules to manufacture. Leading HBM device makers and foundries must simultaneously handle multi-layer chip stacking, die warpage, and shorter product lifecycles that are shrinking from two years down to just one. But perhaps the most formidable c... » read more

How 3D-IC Will Change Chip Design
By Ed Sperling - 08 Oct, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss 3D-IC design challenges and the impact on stacked die on EDA tools and methodologies, with John Ferguson, senior director of product management at Siemens EDA; Mick Posner, senior product group director for chiplet at IP solutions in Cadence's Compute Solutions Group; Mo Faisal of Movellus; Chris Mueth, new opportunities busine... » read more

How To Cool 3D-ICs
By Ed Sperling - 01 Oct, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss how to cool 3D-ICs and what's missing from the tool chain today, with John Ferguson, senior director of product management at Siemens EDA; Mick Posner, senior product group director for chiplet at IP solutions in Cadence's Compute Solutions Group; Mo Faisal of Movellus; Chris Mueth, new opportunities business manager at Keysigh... » read more

Calibre 3DStress: Advanced Stress Analysis For Reliable 3D IC Design
By Siemens EDA - 03 Sep, 2025 - Comments: 0

As the industry transitions toward advanced 3D IC architectures and heterogeneous integration, managing thermo-mechanical stress is essential for product quality and long-term reliability. Calibre 3DStress enables design and packaging teams to simulate, analyze and disposition stresses imparted on the chip during or after the packaging process, ensuring that potential failure risks—such as wa... » read more

Launching The Full Potential Of 3D IC With Front-End Architectural Planning
By Siemens EDA - 19 Aug, 2025 - Comments: 0

3D IC and chiplet-based design have the potential to accelerate the pace of semiconductor industry innovation. 3D IC design teams pack more functionality closer together and achieve higher levels of systems integration and performance in a smaller footprint faster than what’s possible with traditional SoC implementation. To achieve the full potential of 3D IC, teams need cost-effective fro... » read more

EDA’s Top Execs Map Out An AI-Driven Future
By Ed Sperling - 23 Jun, 2025 - Comments: 0

Artificial intelligence is permeating the entire semiconductor ecosystem, forcing fundamental changes in AI chips, the design tools used to create them, and the methodologies used to ensure they will work reliably. This is a global race that will redefine nearly every domain over the next decade. In presentations and interviews over the past several months, top EDA executives converged on th... » read more

Navigating Increased Complexity In Advanced Packaging
By Gregory Haley - 17 Dec, 2024 - Comments: 1

As chips evolve toward stacked, heterogeneous assemblies and adopt more complex materials, engineers are grappling with new and often less predictable sources of variation. This is redefining what it means to achieve precision, forcing companies to rethink everything from process control and in-line metrology to materials selection and multi-level testing. These assemblies are the result of ... » read more

How Die Dimensions Challenge Assembly Processes
By Anne Meixner - 19 Sep, 2024 - Comments: 1

Multi-die assemblies are becoming more common and more complex due to technology advancements and market demands, but differing die dimensions are making this process increasingly challenging. To fully enable a multi-chiplet ecosystem, standardized component handling and interfaces are needed. The underlying concept is similar to LEGO blocks that simply snap together, yet it's nowhere near t... » read more

Memory On Logic: The Good And Bad
By Brian Bailey - 11 Apr, 2024 - Comments: 0

The chip industry is progressing rapidly toward 3D-ICs, but a simpler step has been shown to provide gains equivalent to a whole node advancement — extracting distributed memories and placing them on top of logic. Memory on logic significantly reduces the distance between logic and directly associated memory. This can increase performance by 22% and reduce power by 36%, according to one re... » read more

Enabling Test Strategies For 2.5D, 3D Stacked ICs
By Laura Peters - 08 Sep, 2022 - Comments: 0

Improved testability, coupled with more tests at more insertion points, are emerging as key strategies for creating reliable, heterogeneous 2.5D and 3D designs with sufficient yield.  Many changes need to fall into place to make side-by-side 2.5D and 3D stacking approaches cost-effective, particularly for companies looking to integrate chiplets from different vendors. Today, nearly all of t... » read more

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