tag: stacked die

The Shape Of Things To Come
By Ed Sperling - 13 Jun, 2013 - Comments: 0

By Ed Sperling The standard method of designing chips—by shrinking features and turning up the clock frequency—is running out of steam for many companies. It’s too difficult, too expensive, and without a commercially viable new lithography source it may become even more unrealistic for most applications. That certainly doesn’t mean Moore’s Law is ending, but it could become more o... » read more

Pushing The Limits
By Ed Sperling - 13 Jun, 2013 - Comments: 0

Ever since the turn of the millennium, researchers have been warning that wires and interconnects will have issues. Electron crashes were reported as early as 2001, and electromigration is rising to the forefront of problems at advanced nodes. The result? Chipmakers are looking at thicker wires for the first time as a way of dealing with resistance and capacitance issues. While this makes se... » read more

Experts At The Table: The Growing Signoff Headache
By Ed Sperling - 07 Jun, 2013 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down to discuss signoff issues with Rob Aitken, an ARM fellow; Sumbal Rafiq, director of engineering at Applied Micro; Ruben Molina, product marketing director for timing signoff at Cadence; Carey Robertson, director of product marketing for Calibre extraction at Mentor Graphics; and Robert Hoogenstryd, director of marketing for design ... » read more

Tech Talk: FinFETs, FD-SOI And The Future Of SoC Design
By Ed Sperling - 04 Jun, 2013 - Comments: 0

Mary Ann White, marketing manager for Synopsys' Galaxy Implementation Platform, talks with Low-Power/High-Performance Engineering about new opportunities to reduce power and improve performance, and where the pain points will be. [youtube vid=kuJdcHIRxfU] » read more

Executive Briefing: Stacking The Odds
By Ed Sperling - 29 May, 2013 - Comments: 0

Open-Silicon CEO Naveed Sherwani talks with System-Level Design about progress on 2.5D and 3D stacked die, why this approach is inevitable, when it will begin and what markets will use it first. [youtube vid=mzwpgDKuIok] » read more

3D Brings Test Into Fashion
By Ann Mutschler - 16 May, 2013 - Comments: 0

By Ann Steffora Mutschler As integral and critical as test is to the success of an SoC, it isn’t always one of those topics in semiconductor design that seems fashionable. But as Bassilios Petrakis, director of product marketing for test products at Cadence pointed out, “[Test] is not in fashion, but when we hit one of those brick walls then suddenly we have to think how we are going to... » read more

3D NAND Market Heats Up
By Mark LaPedus - 16 May, 2013 - Comments: 0

By Mark LaPedus It’s the tale of two promising and separate 3D chip architectures. One technology is slowly taking root, while the other one is heating up. 3D stacked-die using through-silicon vias (TSVs) is on the slower path. Advanced chip-stacking has several challenges and is still a few years away from mass production. In contrast, 3D NAND is heating up, as Samsung and SK Hynix are a... » read more

Executive Briefing: Andrew Yang
By Ed Sperling - 09 May, 2013 - Comments: 0

By Ed Sperling Andrew Yang, president of ANSYS subsidiary Apache Design, sat down with Low-Power/High-Performance Engineering to talk about why power is becoming so important and where the future challenges lie. What follows are excerpts of that conversation. LPHP: What’s the most important issue these days for chipmakers? Yang: According to the feedback we’ve gotten from our customer... » read more

The Power Problem
By Ed Sperling - 09 May, 2013 - Comments: 0

For the past few years, EDA companies have been warning chipmakers that power will become the biggest issue they face at future nodes. They were right. While it may not be the only big problem—after all, the number of issues at each new tick of Moore’s Law is growing—power is certainly one of the most challenging and by far the most pervasive. In fact, the warnings about just how perni... » read more

Experts At The Table: Issues In Metrology And Inspection
By Mark LaPedus - 29 Apr, 2013 - Comments: 0

By Mark LaPedus Semiconductor Manufacturing & Design sat down to discuss future metrology and inspection challenges with John Allgair, senior member of the technical staff at GlobalFoundries; Kevin Heidrich, vice president of marketing and business development at Nanometrics; Robert Newcomb, executive vice president at Qcept Technologies; and Shrinivas Shetty, vice president of marketing f... » read more

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