Test Gets Ready For Wi-Fi 7
By Jan Ermert - 07 Mar, 2023 - Comments: 0

New test solutions are emerging to address the test challenges associated with the forthcoming Wi-Fi 7 standard. Wi-Fi 7 covers the (so far, for Wi-Fi) unused frequency range between 6 GHz and 7.125 GHz, using up to 4096-QAM modulation schemes and up to 320MHz channel bandwidth (see figure 1). Fig. 1: Wi-Fi band ranges are shown here, including the 3x increase in bandwidth enabled by a... » read more

New Wafer-Like And Reticle-Like Sensors Deliver Fast, Easy Measurements Inside The Process Chamber
By CyberOptics - 07 Mar, 2023 - Comments: 0

Setup and maintenance operations for semiconductor manufacturing tools can be tedious, time-consuming, and expensive, incurring both direct costs for personnel and resources and indirect costs for lost tool time during extended commissioning of new tools and requalification of repaired or serviced tools. Wafer-like (and reticle-like) sensors (WaferSense® from CyberOptics) provide fast, easy ac... » read more

Standards: The Next Step For Silicon Photonics
By Karen Heyman - 07 Mar, 2023 - Comments: 0

Testing silicon photonics is becoming more critical and more complicated as the technology is used in new applications ranging from medicine to cryptography, lidar, and quantum computing, but how to do that in a way that is both consistent and predictable is still unresolved. For the past three decades, photonics largely has been an enabler for high-speed communications, a lucrative market t... » read more

How The Doubling Of Interconnect Bandwidth With PCI Express 6.0 Impacts IP Electrical Validation
By Synopsys - 07 Mar, 2023 - Comments: 0

As a result of the innovations taking place in CPUs, GPUs, accelerators, and switches, the interface in hyperscale datacenters now requires faster data transfers both between compute and memory and onto the network. PCI Express (PCIe®) provides the backbone for these interconnects and is used to build protocols such as Computer Express Link (CXL™) and Universal Chiplet Interconnec... » read more

A Journey Of Innovation
By Noa Shinar-Ron - 07 Mar, 2023 - Comments: 0

When Dr. Shay Wolfling, a physics expert, joined Nova as its CTO about 11 years ago, very little about the company was the same as it is today. Over the past decade, Nova has experienced tremendous growth, acquiring two companies, significantly increasing its revenue and employee count, and shifting its technology direction and product lines. Yet, one constant remains: commitment to innovation ... » read more

Epi SiGe Application Using METRION In-Line SIMS System
By Nova - 07 Mar, 2023 - Comments: 0

The epitaxial process is a well-established deposition technique in semiconductor fabrication because it enables the ability to achieve much higher doping concentrations than can be obtained via ion implantation. As we move toward <5nm technology, a key process for enabling gate-all-around FET (GAAFET) is the stacked multi-lattice of Silicon (Si) and Silicon-germanium (SiGe) epi process for ... » read more

Physically Aware NoCs
By Ed Sperling - 06 Mar, 2023 - Comments: 0

More functions, greater security risks, and increasingly complicated integration of IP and various components below 7nm is increasing the time and effort it takes to get a functioning chip out the door. In many of these devices, the network on chip is the glue between various components, but it can take up to 10% to 12% of the total area of the SoC. Andy Nightingale, vice president of product m... » read more

Chip Industry’s Technical Paper Roundup: Mar. 6
By Linda Christensen - 06 Mar, 2023 - Comments: 0

New technical papers recently added to Semiconductor Engineering’s library: [table id=84 /] If you have research papers you are trying to promote, we will review them to see if they are a good fit for our global audience. At a minimum, papers need to be well researched and documented, relevant to the semiconductor ecosystem, and free of marketing bias. There is no cost involved for us ... » read more

Research Bits: March 6
By Jesse Allen - 06 Mar, 2023 - Comments: 0

2D TMDs on silicon Engineers at MIT, University of Texas at Dallas, Institute for Basic Science, Sungkyunkwan University, Washington University in St. Louis, University of California at Riverside, ISAC Research, and Yonsei University found a way to grow 2D materials on industry-standard silicon wafers while preserving their crystalline form. Using a new “nonepitaxial, single-crystalline g... » read more

CXL-Based Memory Pooling System Meets Cloud Performance Goals And Significantly Reduces DRAM Cost
By Technical Paper Link - 05 Mar, 2023 - Comments: 0

A technical paper titled "Pond: CXL-Based Memory Pooling Systems for Cloud Platforms" was published by researchers at Virginia Tech, Intel, Microsoft Azure, Google, and Stone Co. Abstract "Public cloud providers seek to meet stringent performance requirements and low hardware cost. A key driver of performance and cost is main memory. Memory pooling promises to improve DRAM utilization and t... » read more

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