category: Test, Measurement and Analytics

category: Auto, Security & Edge AI

Balancing Parallel Test Productivity With Yield & Cost
By Anne Meixner - 12 Nov, 2024 - Comments: 0

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring consistent test accuracy across multiple sites and reducing test time. Collectively, ATEs and multi-site test boards — DUT interface boards (DIBs), probe cards, and load boards — significantl... » read more

FTIR Detects Counterfeit Electronics
By Inga Koehler - 12 Nov, 2024 - Comments: 0

FTIR spectroscopy detects counterfeit electronics fast and effectively.[1] It provides a critical solution in the fight against counterfeit products that threaten various sectors of our economy. As counterfeits infiltrate industries like fashion, pharmaceuticals, and luxury goods, they pose serious risks. With the advancement of technology, counterfeit components in electronics are becom... » read more

Silicon Carbide And Gallium Nitride Bring New Challenges For Semiconductor Test
By Jeorge Hurtarte - 12 Nov, 2024 - Comments: 0

In the era of megatrends such as electric vehicles (EVs), new technologies are emerging to keep up with evolving demands. One example of this is the evolution of compound semiconductors that use silicon carbide (SiC) and gallium nitride (GaN) for high-performance power systems. Innovating test protocols to handle wide bandgap materials For many power-related applications, the semiconductor in... » read more

A Renaissance Of Innovation
By Keith Schaub - 12 Nov, 2024 - Comments: 0

Innovation in semiconductor testing plays a critical role in the advancement of the semiconductor industry, ensuring that the chips and components that power modern technology are reliable, efficient, and capable of meeting the ever-increasing demands of various applications. As semiconductors become more complex, the methods and technologies used to test them must also evolve to maintain quali... » read more

Outsmarting Silent Data Corruption In AI Processors With Two-Stage Detection
By proteanTecs - 12 Nov, 2024 - Comments: 0

Silent data corruption is on the rise following advancements in semiconductor technology. The explosion in AI for speech, image, video, and text processing leads to a growing complexity and diversity of hardware systems, bringing an increased risk to data integrity. SDC rate is much higher than software engineers expect, undermining the hardware reliability they used to take for granted. Rec... » read more

AI’s Power To Transform Semiconductor Design And Manufacturing
By John Kibarian - 28 Oct, 2024 - Comments: 0

Artificial intelligence and machine learning (AI/ML) have immense power to transform semiconductor design and manufacturing for a variety of broad and far-ranging applications. Just consider the volume of data generated by design and manufacturing each year. With increasingly complex products, machines, processes and supply chains, the overall amount of data associated with semiconductor making... » read more

The Long Climb: Bringing Through Glass Vias (TGV) To High-Volume Manufacturing
By Keith Best - 15 Oct, 2024 - Comments: 0

The semiconductor industry is a land of peaks and valleys. It’s a place where each innovation represents the culmination of a long and often difficult climb to the summit. In the case of glass substrates, the peak of the mountain is in sight. The arrival of glass substrates comes at an opportune time, as the industry eyes new process innovations to meet the incredible demand for high perfo... » read more

Advancements In Silicon Device Technology And Design Driving New SLM Monitor Categories
By Ash Patel - 15 Oct, 2024 - Comments: 1

Silicon, the foundation of modern electronics, has seen continuous advancements since the early days of integrated circuits. The pace of innovation has been driven by the relentless quest for miniaturization, increased performance, and efficiency. However, Moore’s Law is no longer a given and silicon is facing functional limitations as technology scales. To address these challenges and conti... » read more

Metrology Advances Step Up To Sub-2nm Device Node Needs
By Laura Peters - 15 Oct, 2024 - Comments: 0

Metrology and inspection are dealing with a slew of issues tied to 3D measurements, buried defects, and higher sensitivity as device features continue to shrink to 2nm and below. This is made even more challenging due to increasing pressure to ramp new processes more quickly. Metrology tool suppliers must exceed current needs by a process node or two to ensure solutions are ready to meet tig... » read more

From Reaction To Prevention In Data Center RAS
By Noam Brousard - 15 Oct, 2024 - Comments: 0

The rise of artificial intelligence (AI), cloud services, and IoT has fueled the rapid expansion of hyperscale data centers. These massive facilities house thousands of servers, all working to support an increasingly digital world. But as the scale of data centers grows, so too does the need for reliable and high-performance semiconductors. Semiconductor failures and inconsistencies can cause s... » read more

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