category: Test, Measurement and Analytics

category: Auto, Security & Edge AI

Reducing Automotive Failure Rates With QPaaS
By Kiki (Yitzhak) Ohayan - 10 Dec, 2019 - Comments: 0

It’s become an industry cliché to dub modern cars “computers on wheels” – and with 90 percent of automotive innovation now focused on electronics and software, it’s a cliché that happens to be true, and it brings with it the complications that all electronics bring. The sheer number of electronics-driven features – advanced driver assistance systems (ADAS), telematics, navigati... » read more

A Holistic Approach To Yield Management
By Marie Ryan - 10 Dec, 2019 - Comments: 0

At yieldHUB we work with consultants and semiconductor experts, like André van de Geijn, semiconductor expert and author of Collaboratism. He supports our customers on the west coast of the US. We asked him about the benefits of various yield management solutions (YMS). In this article we will explain the benefits with insights from André. Today, people look at their current problem an... » read more

Improving Reliability Monitoring Of High-Bandwidth Memory
By Eyal Fayneh - 10 Dec, 2019 - Comments: 0

As the quest for increased bandwidth and speed continues, multi-die technologies with advanced memory architectures are introduced. As the complexity of these heterogenous packaging continues to develop, new reliability challenges arise. A new approach to HBM subsystem monitoring and repair provides advanced in-field reliability assurance. By applying analytics to data created by on-chip Age... » read more

Testing In Context Gaining Ground
By Jeff Dorsch - 10 Dec, 2019 - Comments: 0

Testing in context is beginning to gain wider appeal as chip complexity increases, and as ICs are deployed in more safety-critical and mission-critical applications. While design in context has been the norm for SoCs for some time, a similar approach in test has been slow going. Cell-aware testing technology was first described a decade ago, and since then its adoption has been modest. But w... » read more

Improving Test Pattern Compression With Tessent VersaPoint Test Point Technology
By Mentor, a Siemens Business - 09 Dec, 2019 - Comments: 0

Mission-critical applications within markets such as transportation and medical devices require higher overall manufacturing test quality, but that often means more test patterns, data volume, and longer test times. Embedded test compression helps, but using VersaPoint test point technology results in 46X compression ration over what is possible with Tessent TestKompress alone. To read more,... » read more

5 Steps To Becoming A Data-Driven Manufacturer
By Optimal Plus - 09 Dec, 2019 - Comments: 0

What does it take to become a data-driven manufacturer. There are five fundamental steps: Get the data you need Organize the data Analyze and present the data Automate analytics Innovate Companies constantly strive to become data-driven. In this way, their decisions can become more objective and more likely to achieve the desired results. In fact, many companies understand t... » read more

Six Things You Need To Know About USB Instrument Control
By NI - 09 Dec, 2019 - Comments: 0

With plug-and-play connectivity and the near ubiquity of USB ports on modern PCs and laptops, USB has become a popular choice for controlling stand-alone instrumentation. As more instrument manufacturers begin to include USB ports on their devices, it is important to understand several issues surrounding USB to ensure the longevity of your test system. To read more, click here. » read more

Using Machine Learning To Break Down Silos
By Ed Sperling - 13 Nov, 2019 - Comments: 0

Jeff David, vice president of AI solutions at PDF Solutions, talks with Semiconductor Engineering about where machine learning can be applied into semiconductor manufacturing, how it can be used to break down silos around different process steps, how active learning works with human input to tune algorithms, and why it’s important to be able to choose different different algorithms for differ... » read more

AI’s Blind Spots
By Ed Sperling - 12 Nov, 2019 - Comments: 1

The rush to utilize AI/ML in nearly everything and everywhere raises some serious questions about how all of this technology will evolve, age and perform over time. AI is very useful at doing certain tasks, notably finding patterns and relationships in broad data sets that are well beyond the capabilities of the human mind. This is very valuable for adding efficiency into processes of all so... » read more

A Breakthrough In Silicon Bring-Up
By Matthew Knowles - 12 Nov, 2019 - Comments: 1

The current semiconductor market is seeing increasingly complex silicon devices for applications like 5G wireless communications, autonomous driving, and artificial intelligence. One of the ways designers are working to control design time and cost is through the adoption of IJTAG (IEEE 1687) for a plug-and-play style IP integration during design. The benefits of using IJTAG are still emerging,... » read more

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