category: Top Stories

category: Auto, Security & Edge AI

The Murky World Of AI Benchmarks
By Ann Mutschler - 30 Apr, 2020 - Comments: 0

AI startup companies have been emerging at breakneck speed for the past few years, all the while touting TOPS benchmark data. But what does it really mean and does a TOPS number apply across every application? Answer: It depends on a variety of factors. Historically, every class of design has used some kind of standard benchmark for both product development and positioning. For example, SPEC... » read more

Inevitable Bugs
By Brian Bailey - 29 Apr, 2020 - Comments: 3

Are bug escapes inevitable? That was the fundamental question that Oski Technology recently put to a group of industry experts. The participants are primarily simulation experts who, in many cases, help direct the verification directions for some of the largest systems companies. In order to promote free discussion, all comments have been anonymized, distilling the primary thoughts of the parti... » read more

Full-Duplex Wireless Remains A Promise And A Challenge
By Bryon Moyer - 27 Apr, 2020 - Comments: 0

Wireless bandwidth capacity could double if we could use full-duplex communication. Unfortunately, that’s not as easy as it sounds. People are working hard on it, but we’re mostly not there yet. Full duplex seems easy. In fact, so easy that it was possible with the first basic telephones. There was one loop between each phone and the central office, and that one loop carried conversation... » read more

Practical Processor Verification
By Brian Bailey - 23 Apr, 2020 - Comments: 0

Custom processors are making a resurgence, spurred on by the early success of the RISC-V ISA and the ecosystem that is rapidly building around it. But this shift is amid questions about whether processor verification has become a lost art. Years ago custom processors were common. But as the market consolidated around a handful of companies, so did the tools and expertise needed to develop th... » read more

Using Processor Trace At The System Level
By Ann Mutschler - 23 Apr, 2020 - Comments: 0

The race to process more data faster using less power is creating a series of debug challenges at the system level, where developers need to be able to trace interactions across multiple and often heterogeneous processing elements that may function independently of each other. In general, trace is a hardware debug feature that allows the run-time behavior of IP to be monitored. More specific... » read more

Re-Imagining The GPU
By SE Staff - 23 Apr, 2020 - Comments: 0

John Rayfield, CTO at Imagination Technologies, sat down with Semiconductor Engineering to talk about RISC-V, AI, and computing architectures. What follows are excerpts of that conversation. SE: What your plans are for RISC-V? Rayfield: We're actively finalizing the integration of RISC-V cores into future-generation GPUs. That work has been going on for several months. Moving forward, we'... » read more

What’s Next With AI In Fabs?
By Mark LaPedus - 22 Apr, 2020 - Comments: 0

Semiconductor Engineering sat down to discuss the issues and challenges with machine learning in semiconductor manufacturing with Kurt Ronse, director of the advanced lithography program at Imec; Yudong Hao, senior director of marketing at Onto Innovation; Romain Roux, data scientist at Mycronic; and Aki Fujimura, chief executive of D2S. What follows are excerpts of that conversation. Part one ... » read more

Scaling CMOS Image Sensors
By Mark LaPedus - 20 Apr, 2020 - Comments: 5

After a period of record growth, the CMOS image sensor market is beginning to face some new and unforeseen challenges. CMOS image sensors provide the camera functions in smartphones and other products, but now they are facing scaling and related manufacturing issues in the fab. And like all chip products, image sensors are seeing slower growth amid the coronavirus outbreak. Manufactured a... » read more

Metrology Challenges For Gate-All-Around
By Mark LaPedus - 16 Apr, 2020 - Comments: 3

Metrology is proving to be a major challenge for those foundries working on processes for gate-all-around FETs at 3nm and beyond. Metrology is the art of measuring and characterizing structures in devices. Measuring and characterizing structures in devices has become more difficult and expensive at each new node, and the introduction of new types of transistors is making this even harder. Ev... » read more

Making Chips At 3nm And Beyond
By Mark LaPedus and Ed Sperling - 16 Apr, 2020 - Comments: 4

Select foundries are beginning to ramp up their new 5nm processes with 3nm in R&D. The big question is what comes after that. Work is well underway for the 2nm node and beyond, but there are numerous challenges as well as some uncertainty on the horizon. There already are signs that the foundries have pushed out their 3nm production schedules by a few months due to various technical issu... » read more

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