category: Videos

category: IoT, Security & Automotive

Improving Quality Through Data Analytics
By Ed Sperling - 11 Sep, 2019 - Comments: 0

Doug Elder, vice president and general manager at OptimalPlus, explains how to utilize data to improve reliability, how it applies to different manufacturing processes, and what happens when that data is made available to more people within an organization. » read more

Ensuring A 5G Design Is Viable
By Ed Sperling - 09 Sep, 2019 - Comments: 0

Ron Squiers, network solutions specialist at Mentor, a Siemens Business, explains what’s different in 5G chips versus 4G, how to construct a front haul and back haul system so it is testable in the network stack. » read more

Using ML For Post-Silicon Validation
By Ed Sperling - 11 Jun, 2019 - Comments: 0

Ira Leventhal, vice president of Advantest’s new concept product initiative, talks about how to use machine learning to ferret out hidden relationships in a complex design and to utilize that data to improve chips. » read more

ATE Lab To Fab
By Ed Sperling - 05 Jun, 2019 - Comments: 2

Shu Li, business development manager at Advantest, zeroes in on the communication gap between engineers on the design side and the manufacturing/test side, why it exists, and what needs to be done to bridge that gap in order to speed up and improve test quality. https://youtu.be/Nd-5_twbJBw     See other tech talk videos here » read more

Making AI More Dependable
By Ed Sperling - 07 May, 2019 - Comments: 0

Ira Leventhal, vice president of Advantest’s new concept product initiative, looks at why AI has taken so long to get going, what role it will play in improving the reliability of all chips, and how to use AI to improve the reliability of AI chips themselves. » read more

Concurrent Test
By Ed Sperling - 11 Jan, 2019 - Comments: 0

Derek Wu, senior staff applications engineer at Advantest, looks at the need for doing multiple tests at the same time as chip designs become more complex, increasingly heterogeneous, and much more difficult to test at advanced nodes. https://youtu.be/-8inbjX_af0       __________________________________ See more tech talk videos here. » read more

AI In Chip Manufacturing
By Ed Sperling - 10 Jan, 2019 - Comments: 0

Ira Leventhal, New Concept Product Initiative vice president at Advantest, talks with Semiconductor Engineering about using analysis and deep learning to make test more efficient and more effective. https://youtu.be/3VVG4JVnjHo » read more

Planarization Challenges At 7nm And Beyond
By Ed Sperling - 10 Dec, 2018 - Comments: 0

Dan Sullivan, executive director of semiconductor technology at Brewer Science, digs into the challenges of planarizing a thin film on a wafer for etch and optical control. The problem becomes more difficult at advanced nodes because the films are thinner. https://youtu.be/iNA6EGpoYZU     _________________________________ See more tech talk videos here   » read more

Using DSA With EUV
By Ed Sperling - 05 Nov, 2018 - Comments: 1

James Lamb, deputy CTO for advanced semiconductor manufacturing and corporate technical fellow at Brewer Science, looks at how directed self-assembly can be used to supplement EUV at advanced nodes. https://youtu.be/PItF4egHOxc     See other tech talk videos here » read more

5G Test And Deployment
By Ed Sperling - 09 Oct, 2018 - Comments: 0

Advantest’s Adrian Kwan talks about 5G test, how it will change as the wireless technology evolves toward higher frequency signals, and what happens when many more users and backward compatibility are added to the network. https://youtu.be/x_-3yX7fWak » read more

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