HW-related security papers at the USENIX Security Symposium include remote direct memory introspection, side channel attacks, transient execution attacks, physical removal on LiDAR, HW-assisted malware analysis, microarchitectural leakage.
A number of hardware security-related technical papers were presented at the August 2023 USENIX Security Symposium. Here are some highlights with associated links.
| Technical Paper | Research Organizations |
|---|---|
| Remote Direct Memory Introspection | Rice University, Duke University, and MIT *Distinguished paper winner* |
| Inception: Exposing New Attack Surfaces with Training in Transient Execution | ETH Zurich |
| Speculation at Fault: Modeling and Testing Microarchitectural Leakage of CPU Exceptions | Microsoft and Vrije Universiteit Amsterdam |
| On the Feasibility of Malware Unpacking via Hardware-assisted Loop Profiling | Shandong University & Hubei Normal University, Tulane University and University of Texas at Arlington |
| NVLeak: Off-Chip Side-Channel Attacks via Non-Volatile Memory Systems | UC San Diego, Purdue University, and UT Austin |
| You Can’t See Me: Physical Removal Attacks on LiDAR-based Autonomous Vehicles Driving Frameworks | University of Michigan, University of Florida and the University of Electro-Communications (Japan) |
| Side-Channel Attacks on Optane Persistent Memory | University of Virginia, Cornell University, and Graz University of Technology |
| ProSpeCT: Provably Secure Speculation for the Constant-Time Policy | imec-DistriNet, KU Leuven, CEA, and INRIA |
A complete listing of all papers presented at this summer’s USENIX conference can be found here and here. The organization provides open access research, and the presentation slides and papers are free to the public. Other topics covered include privacy, cryptography, authentication, smart vehicle and mobile security, machine learning, cryptocurrency, fuzzing and more.
Related Reading
Security papers in Semiconductor Engineering’s technical paper library.
Semiconductor Engineering’s entire Technical Paper Library
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