tag: 3D-IC

Achieving Fast And Accurate Extraction Of 3D-IC Layout Structures
By Various Writers - 26 Jul, 2012 - Comments: 0

The electronics industry is devoting a lot of energy to exploring “More than Moore’s Law” approaches that drive continued value scaling through system integration, rather than (or in addition to) shrinking transistors. One of the most promising techniques is the creation of 3D-ICs using TSV structures. However, accurately modeling a 3D multi-die system requires tools that extract precise ... » read more

Experts At The Table: Pain Points
By Ed Sperling - 20 Jul, 2012 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down with Vinod Kariat, a Cadence fellow; Premal Buch, vice president of software engineering at Altera; Vic Kulkarni, general manager of Apache Design; Bernard Murphy, CTO at Atrenta, and Laurent Moll, CTO at Arteris. What follows are excerpts of that conversation. LPHP: With stacked die it’s no longer one company making an SoC. W... » read more

Stacking The Deck
By Matt Elmore - 12 Jul, 2012 - Comments: 0

By Matt Elmore Can we finally say that 3D-IC design has emerged from the realm of theory and research to actual commercial implementation? Xilinx recently announced initial shipments of its Virtex-7 H580T FPGA, described as “The world’s first 3D heterogeneous all programmable product.” The benefits of 3D implementation are many, as are its challenges. One of the hottest 3D-IC topics t... » read more

Experts At The Table: Pain Points
By Ed Sperling - 12 Jul, 2012 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down with Vinod Kariat, a Cadence fellow; Premal Buch, vice president of software engineering at Altera; Vic Kulkarni, general manager of Apache Design; Bernard Murphy, CTO at Atrenta, and Laurent Moll, CTO at Arteris. What follows are excerpts of that conversation. LPHP: Where will the pain points be going forward? Kariat: 20nm is... » read more

All Indicators Point North
By Ed Sperling - 28 Jun, 2012 - Comments: 0

Designing and producing chips has always been difficult, but the number of things that conspire to make it harder at 20nm is the longest in the history of the semiconductor industry. The list will grow longer still at 14nm and beyond, not to mention so expensive that one mistake will kill a company. While system engineers and architects look at the challenges on the front end, the problems ... » read more

Fabless-Foundry Model Under Stress
By Ed Sperling - 26 Jun, 2012 - Comments: 0

By Mark LaPedus The semiconductor roadmap was once a smooth and straightforward path, but chipmakers face a bumpy and challenging ride as they migrate to the 20nm node and beyond. Among the challenges seen on the horizon are the advent of 3D stacking, 450mm fabs, new transistor architectures, multi-patterning, and the questionable availability of extreme ultraviolet (EUV) lithography. ... » read more

Bucket Lists
By Ed Sperling - 26 Jun, 2012 - Comments: 0

At 130nm, the introduction of copper interconnects, 300mm wafers and low-k dielectrics left the entire supply chain breathless. There had never been as many changes at a single process node in the history of semiconductors. At 28nm, the number of changes will pale compared to what’s necessary at 20nm, and that will pale to what’s required at 14nm. But unlike 130nm, when most of those cha... » read more

Bigger Shifts Ahead
By Ed Sperling - 29 May, 2012 - Comments: 0

At 130nm the manufacturing portion of the semiconductor industry struggled with copper interconnects, 300mm wafers and immersion lithography. At 20nm and 14nm it will have to grapple with double, triple and possibly even quadruple patterning, new gate structures, the usual increases in process variation, far more expensive designs, complex challenges in attaining reasonable yields and in connec... » read more

Packaging Tradeoffs More Complex Than Ever
By Ed Sperling - 24 May, 2012 - Comments: 0

By Ann Steffora Mutschler Driven by high-speed interfaces, the demand for TSVs and the complexities that new process nodes bring, older packaging technologies like wirebonding can’t keep up. The latest and greatest flip chip technologies offer much more flexibility, but at a cost. As such, the package plays a larger role than ever in determining system specifications because, depending o... » read more

New Power Standards Ahead
By Ed Sperling - 10 May, 2012 - Comments: 0

By Ed Sperling Standards groups are beginning to look at power and other physical effects much more seriously in the wake of the dueling power formats—UPF and CPF—that have caused angst across the design industry. To put it in perspective, when CPF and UPF were first introduced power was something of an afterthought in design. At 65nm it ceased to be something that could be dealt with l... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2026 SMG   |  Terms of Service  |  Privacy Policy