Where Are We On The Road To Artificial Intelligence In Chip Design?


It’s hard to find an article today that doesn’t talk about how Artificial Intelligence is going to solve every possible problem in the world. From self-driving cars, to robots running an entire hotel (in Japan), to voice assistants answering your every question, it appears that every problem can be solved with AI. As so often in life, the true answer is: it depends. It depends on the nature... » read more

The Precision Knob


Precision used to be a goal, but increasingly it is being used as a tool. This is true for processing and algorithms, where less precision can greatly improve both performance and battery life. And it is true in manufacturing, where more precision can help minimize the growing impact of variation. Moreover, being able to dial precision up or down can help engineers see the impact on a system... » read more

The Role Of EDA In AI


Semiconductor Engineering sat down to discuss the role that EDA has in automating artificial intelligence and machine learning with Doug Letcher, president and CEO of Metrics; Daniel Hansson, CEO of Verifyter; Harry Foster, chief scientist verification for Mentor, a Siemens Business; Larry Melling, product management director for Cadence; Manish Pandey, Synopsys fellow; and Raik Brinkmann, CEO ... » read more

EDA, IP Revenue Down


EDA and IP revenue dropped 3.1% in Q4 2018 to $2.570 billion, versus $2.652 billion in the same period in 2017, ending a streak of 11 consecutive positive quarters of growth, according to the statistics released today by the Electronic System Design (ESD) Alliance. One quarter doesn't indicate a trend, but it certainly gets everyone's attention after nearly three years of positive news. Now ... » read more

From AI Algorithm To Implementation


Semiconductor Engineering sat down to discuss the role that EDA has in automating artificial intelligence and machine learning with Doug Letcher, president and CEO of Metrics; Daniel Hansson, CEO of Verifyter; Harry Foster, chief scientist verification for Mentor, a Siemens Business; Larry Melling, product management director for Cadence; Manish Pandey, Synopsys fellow; and Raik Brinkmann, CEO ... » read more

Preparing For War On The Edge


War clouds are gathering over the edge of the network. The rush by the reigning giants of data—IBM, Amazon, Facebook, Alibaba, Baidu, Microsoft and Apple—to control the cloud by building mammoth hyperscale data centers  is being met with uncertainty at the edge of the network. In fact, just the emergence of the edge could mean that all bets are off when it comes to data dominance. It... » read more

Utilizing More Data To Improve Chip Design


Just about every step of the IC tool flow generates some amount of data. But certain steps generate a mind-boggling amount of data, not all of which is of equal value. The challenge is figuring out what's important for which parts of the design flow. That determines what to extract and loop back to engineers, and when that needs to be done in order to improve the reliability of increasingly com... » read more

The Automation Of AI


Semiconductor Engineering sat down to discuss the role that EDA has in automating artificial intelligence and machine learning with Doug Letcher, president and CEO of Metrics; Daniel Hansson, CEO of Verifyter; Harry Foster, chief scientist verification for Mentor, a Siemens Business; Larry Melling, product management director for Cadence; Manish Pandey, Synopsys fellow; and Raik Brinkmann, CEO ... » read more

The Problem With Post-Silicon Debug


Semiconductor engineers traditionally have focused on trying to create 'perfect' GDSII at tape-out, but factors such as hardware-software interactions, increasingly heterogeneous designs, and the introduction of AI are forcing companies to rethink that approach. In the past, chipmakers typically banked on longer product cycles and multiple iterations of silicon to identify problems. This no ... » read more

Using Sensor Data To Improve Yield And Uptime


Semiconductor equipment vendors are starting to add more sensors into their tools in an effort to improve fab uptime and wafer yield, and to reduce cost of ownership and chip failures. Massive amounts of data gleaned from those tools is expected to provide far more detail than in the past about multiple types and sources of variation, including when and where that variation occurred and how,... » read more

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