Week In Review: Design, Low Power


ANSYS acquired the assets of DfR Solutions, a developer of automated design reliability analysis software. Founded in 2004 and based in Maryland, DfR's tool translates ECAD and MCAE data into 3D finite element models, automates thermal derating and performs thermal and mechanical analysis of electronics earlier in the design cycle. "ANSYS brings industry-leading electronic simulation capabiliti... » read more

Dude, Where’s My Autonomous Car?


Researchers forecast that by 2025 we’ll see approximately 8 million autonomous or semi-autonomous vehicles on the road. Before merging onto roadways, autonomous cars will first have to progress through 6 levels of driver-assistance technology advancements. What exactly are these levels? And where are we now? The Society of Automotive Engineers (SAE) defines 6 levels of driving automatio... » read more

Make Your Own Energy


Regenerative braking and other forms of energy capture are becoming more popular and increasingly effective. What started as a way of increasing the range of electric or hybrid vehicles is now being applied to everything from green buildings to industrial robots. The automotive industry is still the main driver of this technology. The idea that braking can generate energy has been around for... » read more

Joint Optimization Of Hardware And Compiler


ASPLOS is the premier forum for multidisciplinary systems research spanning computer architecture and hardware, programming languages and compilers, operating systems and networking. This presentation proposes a novel approach for joint optimization of algorithms/compilers and hardware architecture. The top-down/integrated approach that leverages the latest machine learning framework/compile... » read more

IP Requires System Context At 6/5/3nm


Driven by each successive generation of semiconductor manufacturing technology, complexity has reached dizzying levels. Every part of the design, verification and manufacturing is more complicated and intense the more transistors are able to be packed onto a die. For these reasons, the entire system must be taken into consideration as a whole – not just as individual building blocks as could ... » read more

Blog Review: May 1


Synopsys' Melissa Kirschner questions whether a unified standard for safety-related code development will be enough to secure connected cars as MISRA and AUTOSAR merge C++ guidelines. In a podcast, Mentor's Brent Klingforth and John McMillan share questions and answers about rigid-flex PCB design, including the value of incorporating flexible circuits and the key challenges faced when doing ... » read more

Week in Review: IoT, Security, Auto


Internet of Things Wing received an Air Carrier Certification from the Federal Aviation Administration to begin making commercial deliveries with drones. The Alphabet unit is cleared to deliver packages in southwestern Virginia. Wing has had a pilot program going in the vicinity of Canberra, Australia, and was recently permitted to make commercial deliveries with unmanned aerial vehicles in th... » read more

Week In Review: Design, Low Power


A new working group has been proposed by Accellera to focus on the standardization of analog/mixed signal extensions (AMS) for the Universal Verification Methodology (UVM) standard. “Our ambition is to apply UVM for both digital and analog/mixed-signal verification,” said Martin Barnasconi, Accellera Technical Committee Chair. “The UVM-AMS PWG will assess the benefits of creating analog a... » read more

Where Are We On The Road To Artificial Intelligence In Chip Design?


It’s hard to find an article today that doesn’t talk about how Artificial Intelligence is going to solve every possible problem in the world. From self-driving cars, to robots running an entire hotel (in Japan), to voice assistants answering your every question, it appears that every problem can be solved with AI. As so often in life, the true answer is: it depends. It depends on the nature... » read more

Automotive, AI Drive Big Changes In Test


Design for test is becoming enormously more challenging at advanced nodes and in increasingly heterogeneous designs, where there may be dozens of different processing elements and memories. Historically, test was considered a necessary but rather mundane task. Much has changed over the past year or so. As systemic complexity rises, and as the role of ICs in safety-critical markets continues ... » read more

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