tag: Paul Scherrer Institute

Manufacturing Bits: Jan. 16
By Mark LaPedus - 16 Jan, 2018 - Comments: 0

Coherent X-ray imaging Russia’s National University of Science and Technology MISIS has developed a non-destructive way to observe the inner structures of photonic crystals. The technology, called ptychographic coherent X-ray imaging, obtains the electron density of colloidal crystals. Ptychography is a lensless, X-ray coherent imaging technique. Others are also working on the techno... » read more

Searching For EUV Mask Defects
By Mark LaPedus - 19 Oct, 2017 - Comments: 2

Chipmakers hope to insert extreme ultraviolet (EUV) lithography at 7nm and/or 5nm, but several challenges need to be solved before this technology can be used in production. One lingering issue that is becoming more worrisome is how to find [gettech id="31045" comment="EUV"] mask defects. That isn't the only issue, of course. The industry continues to work on the power source and resists. Bu... » read more

Manufacturing Bits: Aug. 29
By Mark LaPedus - 29 Aug, 2017 - Comments: 2

Compact synchrotron EUV sources For some time, the industry has been exploring the development of next-generation power sources for extreme ultraviolet (EUV) lithography. ASML and Gigaphoton are separately developing EUV sources based on the more traditional and compact laser-produced-plasma (LPP) technology. Then, in R&D, others are exploring the development of futuristic EUV sources us... » read more

Manufacturing Bits: Aug. 1
By Mark LaPedus - 01 Aug, 2017 - Comments: 0

Magnetic chips HRL Laboratories—an R&D venture between Boeing and General Motors—has been awarded a contract to develop a new class of magnetic integrated components. HRL has received the award from the Defense Advanced Research Project Agency (DARPA) under the Magnetic, Miniaturized, and Monolithically Integrated Components (M3IC) program. The goal is to develop new magnetic materials... » read more

Manufacturing Bits: July 25
By Mark LaPedus - 25 Jul, 2017 - Comments: 0

Metrology for the intelligence community The semiconductor industry continues to move full speed ahead with traditional chip scaling. There are several challenges in the arena. One of the big but lessor known challenges is metrology. Metrology, the science of characterizing and measuring films and structures, is becoming more complex, challenging and expensive at each node. Looking to solv... » read more

Manufacturing Bits: June 27
By Mark LaPedus - 27 Jun, 2017 - Comments: 0

World’s brightest laser The University of Nebraska-Lincoln has set the unofficial record for the world’s brightest laser. Researchers have focused a laser at a brightness of 1 billion times greater than the surface of the sun. This feat was accomplished using the so-called Diocles Laser at the University of Nebraska-Lincoln. The laser has a combination of peak power and a repetition ra... » read more

The Week In Review: Manufacturing
By Mark LaPedus - 23 Jun, 2017 - Comments: 0

Chipmakers The NAND market is in flux. Not long ago, troubled Toshiba put its memory unit on the block. Finally, the company has selected a group to buy its memory business. The consortium includes the Innovation Network Corp. of Japan, the Development Bank of Japan and Bain Capital. Rival SK Hynix is also part of the group. Others attempted to bid on the business, including Western Digita... » read more

System Bits: April 4
By Ann Mutschler - 04 Apr, 2017 - Comments: 0

Nanodevices for extreme environments in space, on earth Researchers at the Stanford Extreme Environment Microsystems Laboratory (XLab) are on a mission to conquer conditions such as those found on Venus: a hot surface pelted with sulfuric acid rains, 480 degrees C, an atmosphere that would fry today’s electronics. By developing heat-, corrosion- and radiation-resistant electronics, the team ... » read more

Manufacturing Bits: Aug. 30
By Mark LaPedus - 30 Aug, 2016 - Comments: 0

Redefining the ampere In 2014, an international group called the BIPM agreed to redefine four common units of measurements--the kilogram, the ampere, the kelvin and the mole. These units of measurement make up the so-called International System of Units or SI. In total, there are seven SI base units—meter, kilogram, second, ampere, kelvin, mole, and the candela. Work is already under wa... » read more

Manufacturing Bits: April 5
By Mark LaPedus - 05 Apr, 2016 - Comments: 0

Food in 3D Using a technology called ptychographic X-ray computed tomography, the University of Copenhagen and the Paul Scherrer Institute have taken images of food in three dimensions and on a nanometer scale. Ptychography, a lensless coherent imaging technique, could potentially save the food industry money. It could reduce food waste due to faulty production methods. Ptychography could ... » read more

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