tag: Siemens

Moving Beyond Assertions: An Innovative Approach to Low-Power Checking Using UPF Tcl Apps
By Mentor, a Siemens Business - 11 Sep, 2019 - Comments: 0

This paper uses examples and case studies to demonstrate how to leverage UPF 3.0 information model TCL query functions (aka Tcl Apps) and tool provided CLI commands to do low-power checking of a design. This is an innovative way to dynamically verify the low-power intent after simulation has completed and all waveforms are available. The paper also explains how users can write their own checker... » read more

Blog Review: Sept. 11
By Jesse Allen - 11 Sep, 2019 - Comments: 0

Cadence's Paul McLellan checks out the challenges of processing-in-memory and the steps involved in building a logic flow on a DRAM process. Synopsys' Taylor Armerding notes that with safety-critical software an ever-present factor in modern life, it's more necessary than ever to take the time to ensure quality and security when failures can be life-threatening. In a video, Mentor's Colin... » read more

Test On New Technology’s Frontiers
By SE Staff - 10 Sep, 2019 - Comments: 2

Semiconductor testing is getting more complicated, more time-consuming, and increasingly it requires new approaches that have not been fully proven because the technologies they are addressing are so new. Several significant shifts are underway that make achieving full test coverage much more difficult and confidence in the outcome less certain. Among them: Devices are more connected an... » read more

Highly Efficient Scan Diagnosis With Dynamic Partitioning
By Jayant D'Souza - 10 Sep, 2019 - Comments: 0

Charged with the task of improving yield, product engineers need to find the location of defects in manufactured ICs quickly and efficiently. Typically, they use volume scan diagnosis to generate large amounts of data from failing test cycles, which is then analyzed to reveal the location of defects. Scan failure data provides the basis for many decisions in the failure analysis and yield impro... » read more

Improve Volume Scan Diagnosis Throughput 10X With Dynamic Partitioning
By Mentor, a Siemens Business - 09 Sep, 2019 - Comments: 0

Performing volume scan diagnosis on today’s large, advanced node designs puts demands on turn-around-time and compute resources. This paper describes a new technique to maximize diagnosis throughput while performing ever more demanding scan diagnosis. The dynamic partitioning technology in Tessent Diagnosis enables in a 50% reduction in scan diagnosis time using only 20% of the typical memory... » read more

Ensuring A 5G Design Is Viable
By Ed Sperling - 09 Sep, 2019 - Comments: 0

Ron Squiers, network solutions specialist at Mentor, a Siemens Business, explains what’s different in 5G chips versus 4G, how to construct a front haul and back haul system so it is testable in the network stack. » read more

Week In Review: Design, Low Power
By Jesse Allen - 06 Sep, 2019 - Comments: 0

Rambus will acquire the Silicon IP, Secure Protocols and Provisioning business from Verimatrix, formerly Inside Secure. The secure silicon IP and provisioning solutions from both companies will be integrated into a single portfolio of products and the embedded security teams from Verimatrix will join Rambus. “Integrating the Verimatrix embedded security team into Rambus, a recognized leader i... » read more

Machine Learning For Autonomous Drive
By Anoop Saha - 05 Sep, 2019 - Comments: 0

Advances in Artificial Intelligence (AI) and Machine Learning (ML) is arguably the biggest technical innovation of the last decade. Although the algorithms for AI have been in existence for many years, the recent explosion of both data as well as faster compute made it possible to apply those algorithms to solve many real life use cases. One of the most prominent of these use cases is fully aut... » read more

Challenges To Building Level 5 Automotive Chips
By Ann Mutschler - 05 Sep, 2019 - Comments: 0

It’s an exciting time in the automotive space, and this is especially true when it comes to all of the activity around autonomous driving and the path to achieving full Level 5 autonomy. The technology is complex, the ecosystem seems to get more complex by the day, and simulating autonomous systems safely makes this an extremely fascinating area from an engineering perspective. At the heart o... » read more

Creating A Unified Platform For Automotive Embedded Application Development
By Mentor, a Siemens Business - 04 Sep, 2019 - Comments: 0

Automotive embedded software complexity is ballooning as software applications play a critical role in delivering the features and functionality demanded in modern vehicles. Current software development methodologies are incapable of managing the numerous and intricate cyber-physical interfaces in the cars of today. To compete, companies must evolve their software development processes to estab... » read more

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