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Geo-Spatial Outlier Detection


Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and why. The main idea in outlier detection is to find something in or on a die that is different from all the other dies on a wafer. Doing this in the context of a die’s neighbor has become easie... » read more

18 Things Fabless Start-Ups Should Look For In A Yield Management System


Do you work for a fabless start-up? Are you ramping up? If so, you need data-analysis tools for your production data. You will struggle without them. You have two options for yield management analysis. You may decide to hire an engineer (or team of engineers) whose job it is to transfer the data from datalogs to a spreadsheet. Then generate reports. Or, you could invest in a system that takes c... » read more

6 Signs You Need A Yield Management System


We often speak to companies who don’t know if they need yield management software yet. While most semiconductor companies need to invest in yield management, there could be instances where you’ll get by without one for a while. This article is for companies that use an internal option (such as Excel or JMP) and those who don’t have yield management at all. We will share the six most obvio... » read more