Testing High Power Discrete Devices
Increased power requirements mean more power is being driven through smaller devices.
Emerging markets are driving the evolution of discrete power devices. Increased power requirements mean more power is being driven through a smaller device, creating challenges in both device design and test. This video series, 3 for 3, provides 3 answers for 3 pressing questions about trends in semiconductor test, and how testing for high power discrete devices is evolving.
Tom Tran
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Tom Tran is a product manager for Power Discrete Test at Teradyne. With over 15 years of test development experience in power management, precision analog and mixed signal semiconductors, Tom has been instrumental in the success of many projects on Teradyne’s ETS platform. Prior to his role as a product manager, Tran was a field product specialist, who contributed to the successful adoption of Teradyne’s power discrete testers for wafer sort and power module testing at several customer sites around the world. He holds a BSEE from the University of Arizona.
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