Continuing Challenges For Open-Source Verification


Experts at the Table: This is the last part of the series of articles derived from the DVCon panel that discussed Verification in the Era of Open Source. It takes the discussion beyond what happened in the panel and utilizes some of the questions that were posed, but never presented to the panelists due to lack of time. Contributing to the discussion are Ashish Darbari, CEO of Axiomise; Serge L... » read more

Do We Have An IC Model Crisis?


Models are critical for IC design. Without them, it's impossible to perform analysis, which in turn limits optimizations. Those optimizations are especially important as semiconductors become more heterogenous, more customized, and as they are integrated into larger systems, creating a need for higher-accuracy models that require massive compute power to develop. But those factors, and other... » read more

Pushing The Limits Of Hardware-Assisted Verification


As semiconductor complexity continues to escalate, so does the reliance on hardware-assisted simulation, emulation, and prototyping. Since chip design first began, engineers have complained their design goals exceeded the capabilities of the tools. This is especially evident in verification and debug, which continue to dominate the design cycle. Big-iron tooling has enabled design teams to k... » read more

Scaling Simulation


Without functional simulation the semiconductor industry would not be where it is today, but some people in the industry contend it hasn't received the attention and research it deserves, causing a stagnation in performance. Others disagree, noting that design sizes have increased by orders of magnitude while design times have shrunk, pointing to simulation remaining a suitable tool for the job... » read more

One-On-One: Lip-Bu Tan


Lip-Bu Tan, CEO of Cadence, sat down with Semiconductor Engineering to talk about the impact of massive increases in data across a variety of industries, the growing need for computational software, and the potential implications of U.S.-China relations. What follows are excerpts of that discussion. SE: What do you see as the biggest change for the chip industry? Tan: We're in our fifth g... » read more

The Increasingly Uneven Race To 3nm/2nm


Several chipmakers and fabless design houses are racing against each other to develop processes and chips at the next logic nodes in 3nm and 2nm, but putting these technologies into mass production is proving both expensive and difficult. It's also beginning to raise questions about just how quickly those new nodes will be needed and why. Migrating to the next nodes does boost performance an... » read more

Demand, Lead Times Soar For 300mm Equipment


A surge in demand for various chips is causing select shortages and extended lead times for many types of 300mm semiconductor equipment, photomask tools, wafers, and other products. For the last several years, 200mm equipment has been in short supply in the market, but issues are now cropping up throughout the 300mm supply chain, as well. Traditionally, lead times have been three to six mont... » read more

Advanced Packaging’s Next Wave


Packaging houses are readying the next wave of advanced packages, enabling new system-level chip designs for a range of applications. These advanced packages involve a range of technologies, such as 2.5D/3D, chiplets, fan-out and system-in-package (SiP). Each of these, in turn, offers an array of options for assembling and integrating complex dies in an advanced package, providing chip custo... » read more

Automotive IC Shortage Drags On


The current automotive semiconductor shortages won’t end anytime soon. When the COVID-19 pandemic hit in early 2020, it wreaked havoc on the worldwide supply chain, but it especially caught automakers flat-footed. When the auto OEMs canceled chip orders during a roughly eight-week period of plant shutdowns, they later found their supplies of critical ICs had evaporated. To make it an ev... » read more

Managing Wafer Retest


Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and result in poor yield, as well as failures in the field. Achieving this balance requires good wafer probing process procedures as well as monitoring of the resulting process parameters, much of it ... » read more

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