Batteries Charge To The Edge


Long-awaited advances in battery chemistry and materials science are beginning to roll out, opening the door for higher capacity, faster charging, and much lower likelihood of thermal runaway. This is a high-stakes race, fueled by an insatiable demand for power everywhere from handheld devices to data centers. When Finland's Donut Lab claimed earlier this year that it had developed a solid-s... » read more

Panel-Level Packaging’s Second Wave Meets Engineering Reality


Key Takeaways Panel-level packaging is arriving not because the engineering is ready, but because wafer-level economics are breaking down. Glass improves the warpage and dimensional stability problems of organic substrates but introduces a different class of failure modes that require materials solutions, not process adjustments. The central challenges of panel-level processing are m... » read more

Chiplet Standards Aim For Plug-n-Play


Key Takeaways Die-to-die chiplet standards are only the beginning. Many more standards are necessary for a chiplet marketplace. A number of such standards have either had initial versions released or are in progress. Existing work covers packaging, a system architecture, various design kits, a universal link layer, and updates to BoW. Today’s chiplets exist in silos. In a ... » read more

Silicon Photonics Lights The Way To More Efficient Data Centers


Key Takeaways Photonic interconnects potentially increase bandwidth density while significantly reducing power consumption. AI workloads are driving their adoption in data centers. On the other hand, photonic interconnects require a variety of different materials, introducing process compatibility and thermal and mechanical stress issues. Integrated electro-optical I/O modules are th... » read more

AI Growing Impact On Chip Design And EDA Tools


Key Takeaways Many workflows in the data center are customer-specific, which is part of the reason there is so much interest in agentic AI-enabled tools. Large systems companies are pressing EDA vendors for performance improvements to keep pace with their AI workflows. The makeup of design teams is changing as AI infiltrates more of the chip design process. Experts at the Ta... » read more

Startup Funding: Q1 2026


The new year started off with a bang for private semiconductor companies, with 18 garnering mega funding rounds exceeding $100 million, and two, Rapidus and Cerebras, reaching the $1 billion mark. Predictably, the vast majority of those are either designing chips primarily for AI inference workloads or attempting to overcome bandwidth limitations by improving interconnects from the chip level t... » read more

DRAM’s Whac‑A‑Mole Security Crisis


Key takeaways: Rowhammer remains a DRAM security threat, while Rowpress has increasingly become a related threat. New commands issued by the memory controller can help manage refreshes, but they’re not a perfect solution. A smaller, vertical DRAM cell may eliminate the problem, but it’s years away. Rowhammer has been a persistent DRAM issue across several memory generati... » read more

A New Era For Co-Processing


Key Takeaways: There is no single processor capable of executing everything efficiently, meaning that multiple processors are required. Maximum efficiency is gained by minimizing the movement of data. Architects must maximize efficiency for today's workloads, while also adding enough flexibility to handle tomorrow's. New processor architectures are rapidly evolving thanks to... » read more

Fast Isn’t Fast Enough: Redefining Metrics for Edge AI


Key Takeaways: Edge AI performance is about low latency and power efficiency, not peak TOPS. Memory bandwidth and data movement now limit edge AI more than compute. Successful edge AI requires balanced hardware, software, and fast model updates. Experts At The Table: Today’s chip architect must contend with multiple factors when architecting AI processors for fast and effi... » read more

What’s Failing At The Interface


Key Takeaways The interface is where failures in advanced packaging become visible, but it's increasingly not where they originate. Weak interfaces often don't fail at time zero, but they do degrade due to parametric drift and margin erosion that binary test screens miss entirely. The temporary test interconnect is the largest variable in the measurement chain and must be controlled ... » read more

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