Chip Industry’s Technical Paper Roundup: July 12

Voltage-controlled MRAM; physical unclonable functions; spiking neural networks in hardware; automotive safety mechanisms; power savings for disaggregated memory; sustainable computing; organic thin film transistors; photonic integrated circuits; image sensors for smartphones; silicon photonic links.


New technical papers recently added to Semiconductor Engineering’s library:

Technical Paper Research Organizations
Reconfigurable Physically Unclonable Functions Based on Nanoscale Voltage-Controlled Magnetic Tunnel Junctions Northwestern University, Western Digital Corporation, Fe Research Inc., and University of Messina
Practical Non-Invasive Probing Attacks Against Novel Carbon-Nanotube-Based Physical Unclonable Functions University of Passau, Chemnitz University of Technology, Fraunhofer Institute for Electronic Nano Systems, and Technical University of Darmstad
Stochastic domain wall-magnetic tunnel junction artificial neurons for noise-resilient spiking neural networks University of Texas at Austin
Best Practices for Advanced Modeling of Safety Mechanisms in an FTA University of Stuttgart, Robert Bosch GmbH, Audi AG, and Porsche AG
DRAM Translation Layer: Software-Transparent DRAM Power Savings for Disaggregated Memory Seoul National University
Towards Sustainable Computing: Assessing the Carbon Footprint of Heterogeneous Systems Arizona State University and University of Minnesota
All Electrohydrodynamic Printed Flexible Organic Thin Film Transistors North Carolina State University
Synchronous micromechanically resonant programmable photonic circuits The MITRE Corporation, Massachusetts Institute of Technology, Sandia National Laboratories, University of Arizona, and Brookhaven National Laboratory
A Review of the Recent Developments in the Fabrication Processes of CMOS Image Sensors for Smartphones Texas A&M University
Massively scalable Kerr comb-driven silicon photonic link Columbia University and Air Force Research Laboratory

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