tag: Mentor

Circuit Aging Becoming A Critical Consideration
By Ann Mutschler - 17 Jun, 2019 - Comments: 5

Circuit aging was considered somebody else's problem when most designs were for chips in consumer applications, but not anymore. Much of this reflects a shift in markets. When most chips were designed for consumer electronics, such as smart phones, designs typically were replaced every couple of years. But with the mobile phone market flattening, and as chips increasingly are used in automot... » read more

Week In Review: Design, Low Power
By Jesse Allen - 14 Jun, 2019 - Comments: 0

M&A Intel will acquire Barefoot Networks, a maker of programmable Ethernet switch silicon and the P4 networking programming language for data centers. Founded in 2013, the Santa Clara-based company has raised $155.4 million in funding. Terms of the deal were not disclosed, but Intel expects the acquisition to be final in the third quarter of this year. Tools & IP Mentor extended it... » read more

Why Chips Are Getting Noisier
By Brian Bailey - 13 Jun, 2019 - Comments: 4

In the past, designers only had to worry about noise for sensitive analog portions of a design. Digital circuitry was immune. But while noise gets worse at newer process nodes, staying at 28nm does not mean that it can be ignored anymore. With Moore's Law slowing, designs have to do more with less. Margins are being squeezed, additional concurrency is added, and attempts are made to opti... » read more

Speed Up P2P Resistance Debugging With Selective Highlighting
By Slava Zhuchenya - 13 Jun, 2019 - Comments: 0

Point-to-point (P2P) resistance simulation calculates the effective parasitic resistance from one or more specified points (sources) to another set of points (sinks) on an integrated circuit (IC) layout. The results of these simulations are a key component in the verification of the robustness and reliability of IC layout interconnect—designers must have this information to accurately perform... » read more

Unveil The Mystery Of Code Coverage In Low-Power Designs: Achieving Power Aware Verification
By Mentor, a Siemens Business - 12 Jun, 2019 - Comments: 0

This paper discusses challenges in code coverage of low-power designs and approaches to overcome those challenges. Also explained is how total coverage results can be visualized in order to achieve verification closure in significantly less time. To read more, click here. » read more

BiST Grows Up In Automotive
By Ann Mutschler - 12 Jun, 2019 - Comments: 0

Test concepts and methods that have been used for many years in traditional semiconductor and SoC design are now being leveraged for automotive chips, but they need to be adapted and upgraded to enable monitoring of advanced automotive systems during operation of a vehicle. Automotive and safety critical designs have very high quality, reliability, and safety requirements, which pairs pe... » read more

Blog Review: June 12
By Jesse Allen - 12 Jun, 2019 - Comments: 0

Synopsys' Taylor Armerding warns that city and state governments aren't learning from history when it comes to ransomware, and despite numerous examples of recent attacks are not implementing proper security measures or even keeping systems patched. Cadence's Paul McLellan shares highlights from the recent Embedded Vision Summit, including how light can be used at femtosecond intervals to ob... » read more

Data Confusion At The Edge
By Ed Sperling - 11 Jun, 2019 - Comments: 0

Disparities in pre-processing of data at the edge, coupled with a total lack of standardization, are raising questions about how that data will be prioritized and managed in AI and machine learning systems. Initially, the idea was that 5G would connect edge data to the cloud, where massive server farms would infer patterns from that data and send it back to the edge devices. But there is far... » read more

Tessent Hierarchical ATPG Reference Flow for Arm Cortex-A75
By Mentor, a Siemens Business - 11 Jun, 2019 - Comments: 0

Arm and Mentor have jointly developed a reference flow for a hierarchical DFT and ATPG implementation with Tessent for any Arm subsystem based on Cortex A-series IP. The reference flow, described in this paper, provides documentation, seamless interfaces, and scripts that accelerate the implementation of a hierarchical test solution. Arm and Mentor are dedicated to enabling customer success, re... » read more

Smart Plug-And-Play DFT For Arm Cores
By Ron Press - 11 Jun, 2019 - Comments: 0

Modern SoCs are experiencing continued growth in capabilities and design sizes with more and more subsystem IPs being implemented. These large, complex, multi-core SoCs need strategies for DFT and ATPG that effectively reduce DFT effort, minimize ATPG runtime, and still achieve the target test coverage. Hierarchical DFT enables designing and testing of these designs in a systematic and repeatab... » read more

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