tag: Siemens EDA

Hardware Models For Software
By Brian Bailey - 24 Nov, 2015 - Comments: 1

Shift left, while a relatively new term, has become important in all parts of the SoC design flow, but its impacts are wide ranging and many still ill defined. It basically means that tasks have to be started earlier than in the past because more accuracy is required from tasks that are further down in the flow in order to make better predictions. It also implies that more steps are performed c... » read more

A Better Way To Measure Heat
By John Parry - 24 Nov, 2015 - Comments: 0

Are you an engineering manager with budget responsibility, concerned about the thermal performance of your company’s designs or manufactured products? Or, are you a senior engineer who is responsible for the thermal design or characterization of components and systems? In either situation, the results of using the transient thermal testing method would be of benefit to you. The method is non-... » read more

Major Growth For Knowledge Center
By Jesse Allen - 24 Nov, 2015 - Comments: 0

First, we would like to thank everyone who has contributed to the success of the Knowledge Center (KC) this year. Its traffic has increased by about 70% over last year and is now giving some of the editorial channels of Semiconductor Engineering a run for their money. The Knowledge Center has two major components. The first are the companies, standards groups and people that drive our indust... » read more

Top Articles For 2015 In SLD And LPHP
By Brian Bailey - 24 Nov, 2015 - Comments: 0

Knowing your readership is the first step in being able to serve them better, and judging by the traffic increases this year, we must be doing quite a few things right. We have now completed our second full year and the first full year for the Knowledge Center (KC). We are pleased with the way in which the two are playing together but there is still a lot of work ahead of and many holes to fill... » read more

Defining Sufficient Coverage
By Brian Bailey - 24 Nov, 2015 - Comments: 2

Semiconductor Engineering sat down to discuss the definition of sufficient coverage as a part of verification closure with Harry Foster, chief scientist at [getentity id="22017" e_name="Mentor Graphics"], Willard Tu, director of embedded segment marketing for [getentity id="22186" comment="ARM"], Larry Vivolo (who at the time of this roundtable was senior director of product marketing for [gete... » read more

6 Key Benefits Of Thermal Testing
By Mentor, a Siemens Business - 23 Nov, 2015 - Comments: 0

This whitepaper discusses the advantages of transient thermal test methods for IC package and thermal interface material (TIM) thermal characterization testing vs steady state methods. These methods assist verification of thermal performance for reliability, support package development & manufacturing decision making, and ensure accurate data sheet values used for selection by engineers. ... » read more

The Week In Review: Design/IoT
By Jesse Allen - 20 Nov, 2015 - Comments: 0

Mergers & Acquisitions On Semiconductor signed a definitive agreement to buy Fairchild Semiconductor for $2.4 billion in cash, combining forces in the power semiconductor market. The deal is the latest in a series of acquisitions and combinations as companies position themselves for the IoT/IoE/IIoT, a world of connected devices that spans from industrial to automotive to smartphones. Comp... » read more

You’re Not Alone
By Srinivas Velivala - 19 Nov, 2015 - Comments: 0

All too often we get caught up in our own work and our own issues, thinking no one else could possibly be having as much trouble as we are. The reality is that many, if not most, of the problems and challenges in IC verification are not unique to one design, one team, or one person. The natural reluctance of people to admit they are struggling with some aspect of their job often keeps them from... » read more

Can Nano-Patterning Save Moore’s Law?
By Mark LaPedus - 19 Nov, 2015 - Comments: 0

For years the academic community has explored a novel technology called selective deposition. Then, more than a year ago, Intel spearheaded an effort to bring the technology from the lab to the fab at 7nm or 5nm. Today, selective deposition is still in R&D, but it is gaining momentum in the industry. With R&D funding from Intel and others, selective deposition, sometimes called ALD-e... » read more

Analog Design And Pattern Matching: A Perfect Pairing
By Ed Sperling - 18 Nov, 2015 - Comments: 0

While automated pattern matching is widely used in the digital IC physical verification process, adoption in the analog space has been much slower. In fact, the very nature of customized analog circuits lends itself ideally to some of the newer physical verification techniques offered by automated pattern matching technology, enabling designers to reduce verification time while still ensuring d... » read more

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