Wire Bond Electrical Structural Test Methodologies


Wire bonding, a foundational process in microelectronics, is essential to establishing a robust and low-resistance electrical connection between semiconductor chips and their respective packages or, in the case of multi-chip modules, between different chips. This intricate process ensures the device's functionality, reliability, and overall performance. Wire bonding faces several challenges ... » read more

Making Cache Coherent SoC Design Easier with Ncore


As the number and variety of computing elements in SoCs grow, specific application areas require the tight connection of key processing elements through coherency. Ncore Interconnect IP from Arteris makes cache coherent SoC designs easier, saving 100’s of person-years effort per project vs DIY solutions. This white paper discusses the challenges and solutions in designing cache-coherent Sy... » read more

Intel and Cadence Collaboration on UCIe: Demonstration of Simulation Interoperability


The Universal Chiplet Interconnect Express (UCIe) 1.0 specification was announced in early 2022. A new updated UCIe 1.1 specification was released on August 8, 2023. The standardized open chiplet standard allows for heterogeneous integration of die-to-die link interconnects within the same package. The UCIe standard allows for advanced package and standard package options to tradeoff cost, band... » read more

As EDA Processes Becomes More Secure, So Do Chips


Security is becoming a much bigger concern within chips and electronic systems, but the actual implementation remains something of an afterthought, which limits its effectiveness. There are many pieces to the security puzzle on the chip design side that go well beyond just securing the hardware or the IP. The EDA tools themselves need to be secure, as well, and so does the user data within t... » read more

Blog Review: Aug. 21


Cadence's Reela Samuel explores the critical role of PCIe 6.0 equalization in maintaining signal integrity and solutions to mitigate verification challenges, such as creating checkers to verify all symbols of TS0, ensuring the correct functioning of scrambling, and monitoring phase and LTSSM state transitions. Siemens' John McMillan introduces an advanced packaging flow for Intel's Embedded ... » read more

Blog Review: Aug. 14


Cadence's Dimitry Pavlovsky highlights two new features in the AMBA CHI protocol Issue G update that enhance security of the Arm architecture: Memory Encryption Contexts, which allows data in each Realm in the memory to be encrypted with a different encryption key, and Device Assignment, which introduces hardware provisions to support fully coherent caches in partially trusted remote coherent d... » read more

Blog Review: Aug. 7


Synopsys' Jyotika Athavale and Randy Fish investigate the problem of silent data corruption caused by difficult-to-detect hardware defects that cause unnoticed errors in the data being processed and is becoming an increasingly pressing problem as computing scales massively at a rapid pace with the demands of AI. Siemens' Keith Felton suggests adopting physical design reuse circuits to provid... » read more

Focus Shifts To Application-Specific Workloads


Experts At The Table: EDA has undergone numerous workflow changes over time. Different skill sets have come into play over the years, and at times this changed the definition of what it means to design at the system level. To work out what this means for designers today, and how it looks going forward, Semiconductor Engineering sat down with Michal Siwinski, chief marketing officer at Arteris; ... » read more

Blog Review: July 31


Cadence's Jasmine Makhija explains how to boost the performance of CXL 3.0 by using NOP (No Operation) Insertion Hints in latency-optimized 256B Flit Mode, which enables the system to quickly revert to the low-latency path after temporarily switching to a higher-latency path due to error correction needs. Synopsys' Robert Fey finds that by automatically and dynamically linking requirements a... » read more

Droop And Silent Data Corruption


By Aakash Jani and Lee Vick Let me set the scene. You are a child psychologist (played by, let’s say, Bruce Willis for illustrative purposes), and you are sitting next to a frightened kid. He turns to you and whispers, “I see dead bits.” Okay, I grant you that’s not exactly the quote, but data center operators are seeing transient errors at an alarming rate, and at scale. These error... » read more

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