What’s needed to ensure reliability of automotive chips, and why it’s about to get even tougher.
Ensuring automotive chips are reliable, defect-free, and secure adds a whole new dimension to design for testability (DFT). Depending on the safety criticality of a system in an automobile, tests can range from key-on, once a car is started, to safety-critical features that may need to be tested every couple hundred milliseconds during operation. Lee Harrison, director of automotive IC solutions in Siemens EDA’s Tessent Division, talks about why logic built-in self-test (LBiST) and memory BiST (MBiST) are so important for test coverage and customization, the impact of standards such as ISO 21434 and Europe’s CRA, and the challenges of using chiplets developed by different vendors.
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