tag: electromigration

Optimizing Analog For Power At Advanced Nodes
By Ann Mutschler - 09 Oct, 2014 - Comments: 0

As any engineering manager will tell you, analog and digital engineers seem like they could be from different planets. While this has changed somewhat over time, [getkc id="52" comment="analog"] is still something of a mystery to many in [getkc id="81" kc_name="SoC"] design teams. Throw power management into the mix and things really get interesting. Improvements in analog/mixed-signal tools... » read more

The Week In Review: Design
By Ed Sperling - 08 Aug, 2014 - Comments: 0

Tools Cadence rolled out a custom power integrity tool for dealing with transistor-level electromigration and IR drop with SPICE-level accuracy. It works in conjunction with the company’s existing power integrity tool for cell-level power signoff. Open-Silicon established a high-speed SerDes technology center of excellence to speed design and production of ASICs using high-speed serial co... » read more

Changing The Meaning Of Sign-Off
By Muhammad Zakir - 07 Aug, 2014 - Comments: 0

Chip development teams are faced with an ever-increasing number of power integrity and reliability challenges these days, especially as designs adopt FinFET technology. Even those with the most thorough sign-off checks often encounter unexpected surprises that quickly turn into tape-out hurdles, or worse yet, extensive re-design. The best way to avoid this scenario and ensure a smoother sign-of... » read more

IP And FinFETs At Advanced Nodes
By Ed Sperling - 10 Jul, 2014 - Comments: 2

Semiconductor Engineering sat down to discuss IP and finFETs at advanced nodes with Bernard Murphy, CTO of Atrenta; Warren Savage, president and CEO of IPextreme; Aveek Sarkar, vice president of engineering and product support at Ansys-Apache; Randy Smith, vice president of marketing at Sonics. What follows are excerpts of that conversation. SE: As we push into the next nodes, we’ve got a ... » read more

FinFET Based Designs: Reliability Verification Implications
By Aveek Sarkar - 10 Jul, 2014 - Comments: 1

Over the past few months, I’ve discussed various challenges associated with finFET-based designs. We all know that finFET devices enable design teams to operate their chips at significantly lower supply voltages with a very tight control on leakage current. But to control the overall power within a tight power budget, the challenge shifts to how the logic design is managed such that the overa... » read more

System-Aware SoC Power, Noise And Reliability Signoff
By Ansys - 09 Jul, 2014 - Comments: 0

In globally competitive markets for mobile, consumer and automotive electronic systems, the critical success factors are power consumption, performance and reliability. To manage these conflicting requirements, design teams consider multiple options, including the use of advanced process technology nodes — especially FinFET-based devices. These advanced technology nodes allow chips to operate... » read more

How Much Will That Chip Cost?
By Ed Sperling - 27 Mar, 2014 - Comments: 1

From the most advanced process nodes to the trailing edge of design there is talk about the skyrocketing cost of developing increasingly complex SoCs. At 16/14nm it’s a combination of multi-patterning, multiple power domains and factoring in physical and proximity effects. At older nodes, it’s the shift to more sophisticated versions of the processes and new tools to work within those proce... » read more

More Pain In More Places
By Ed Sperling - 14 Mar, 2014 - Comments: 2

Pain is nothing new in to the semiconductor industry. In fact, the pain of getting complex designs completed on budget, and finding the bugs in those designs, has been responsible for decades of continuous growth in EDA, IP, test, packaging, and foundries. But going forward there is change afoot in every segment of the flow from architecture to design to layout to verification to manufacturi... » read more

FinFET Reliability Issues
By Arvind Vel - 13 Mar, 2014 - Comments: 0

The 16nm FinFET node has introduced several new challenges in the IC design community. In addition to the complexity of power-noise and electromigration (EM) verification, thermal reliability has become a major concern for both chip and package designers. With the three-dimensional architecture of FinFET devices, new simulation approaches are being used to model thermal behavior of the die in o... » read more

Heat Problems Grow With FinFETs, 3D-ICs
By Ann Mutschler - 13 Feb, 2014 - Comments: 2

From high-end consumer devices to rack-mounted arrays inside of data centers, thermal issues are becoming more serious—and getting much more attention. Driving this shift is the move from single chips to 3D ICs, whether they are interposer-based or stacked die. It’s a well-understood challenge: Die stacking can cause thermal issues because of the lack of a readily accessible thermal diss... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2026 SMG   |  Terms of Service  |  Privacy Policy