Making Hybrid Bonding Better


Key Takeaways Fab processes are optimizing for cleanliness, planarity, and high bond quality. Nanotwinned copper and SiCN PVD enable lower anneal and deposition temperatures for HBM. A thin, protective layer helps preserve the Cu/dielectric during aggressive processes. The future of semiconductor manufacturing is no longer dependent just on shrinking features. Instead, chipm... » read more

Chip Industry Week in Review


The IEEE ISSCC conference was held this week in San Francisco. Among the highlights: IBM detailed an AI accelerator based on its new inferencing dataflow architecture. CEA-Leti presented a chip-scale, ultra-fast, battery-operated EPR spectrometer. QuTech introduced a cryo-CMOS SoC with NV centers in diamond. UTokyo showed its low-jitter PLL architecture for beyond 5G/6G. Imec d... » read more

Understanding Within-Wafer Variations: A Virtual Fabrication Approach


One of the unavoidable aspects of chip manufacturing is that some dies on a wafer perform differently than others, even though they were made together on the same wafer. This blog dives into that mystery and provides a way to predict and fix these issues. Imagine baking cookies. If your oven has hot and cold spots, some cookies will be perfect; others burnt. That’s what happens in chip man... » read more

When Cleaning Chips Isn’t Clean Enough


Key Takeaways Contamination is becoming much more difficult to identify at the most advanced nodes, forcing fabs to rethink how control is achieved. Issues may show up as electrical or statistical anomalies, not particles, and not at time zero. Reliable classification is needed to identify critical contamination and reduce time and effort spent on nuisance failures. For much... » read more

The Race Begins For Much Bigger Abstractions In Data Centers


Key Takeaways Data center build-out is enabling much larger and more complex abstractions. Competition is building for digital/virtual twins across multiple industry segments, including automotive, aerospace, and chip manufacturing. AI, and particularly AI agents, will play a significant role in sorting through data to find potential trouble spots. The frenzy of new data cen... » read more

Chip Industry Week in Review


Intel hired ex-Qualcomm GPU guru Eric Demers for the company's high-performance GPU push, setting the stage for a three-way battle with Nvidia and AMD. The key targets for Intel and AMD will be better power efficiency and a programming model that rivals CUDA, but don't expect Nvidia to stand still. Acquisitions Texas Instruments plans to acquire Silicon Labs for ~$7.5B cash to enhance i... » read more

Blog Review: Feb. 4


Siemens' Tova Levy examines thermal management in 3D-IC, including why heat behaves differently in vertical stacks and how to analyze and manage thermal risk earlier and more predictably to ensure a design can meet performance, reliability, and time-to-market targets. Cadence's Reela Samuel finds that known-good-die strategies, standardized die-to-die test access, and vertical reliability mo... » read more

Why Move To 2nm?


Key Takeaways: Scaling digital logic still provides significant benefits, especially lower power. Multi-die assemblies will be the predominant approach, and most of the circuitry will not be 2nm or below. While these systems are inherently more flexible, the number and complexity of tradeoffs required for optimizing PPA/C are increasing. The rollout of 2nm process nodes and ... » read more

Chip Industry Week In Review


Big deals and fundings Teradyne and MultiLane are forming a joint venture, MultiLane Test Products (MLTP), to accelerate the development of test solutions for high speed data connections.  Teradyne will be the majority owner. Ricursive Intelligence raised $300M Series A for AI-driven IC design. IonQ plans to acquire SkyWater for ~$1.8B, creating a "vertically integrated full-stack q... » read more

Blog Review: Jan. 28


Synopsys' Dana Neustadter and Vincent van der Leest argue that a hardware-based approach to security is required to fully address the risks introduced by modern AI architectures and the distributed workloads they support. Siemens EDA's Tova Levy examines multiphysics challenges in 3D-IC designs and outlines three design imperatives to identify risks earlier and support PPA, reliability, and ... » read more

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