How to ensure that memory is fully tested and repaired.
Increased density at advanced nodes, multi-die assemblies, and the rollout of AI everywhere are making it much more challenging to ensure that memory will function properly over its expected lifetime. Test is no longer about a single memory or one approach for testing memory. It can vary by application, by workload, and by architecture. Some testing is close to memory, some is built into memory, and some is a combination of multiple approaches with corners tied to a particular manufacturing process. Yervant Zorian, chief architect and fellow at Synopsys, and president of Synopsys Armenia, explains why a hierarchical approach is now essential for testing memory, what can go wrong while testing different memories tied to different types of processors, and why massive multi-physics simulations and digital twins are needed for everything from smartphones to robots.
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