Researchers from University at Buffalo-SUNY, The Ohio State University, and Lawrence Livermore National Laboratory published a technical paper titled “Coordination-Sensitive Nanoscale Analysis of Defect-Driven Phase Transformation in Si-Doped (AlxGa1−x)2O3.”
Abstract excerpt:
“Defect-driven phase instability critically influences the structural reliability of ultrawide bandgap oxides, yet direct nanoscale metrics linking local chemistry to structural transformation remain limited. Here, we introduce a coordination-sensitive atom probe tomography framework that quantitatively resolves reductions in local cation coordination and links them directly to defect-driven phase transformation. “
Find the technical paper here. June 2026.
Das, Shaon, et al. “Coordination-Sensitive Nanoscale Analysis of Defect-Driven Phase Transformation in Si-Doped (AlxGa1−x)2O3.” arXiv, June 2026. https://doi.org/10.48550/arXiv.2606.19653.
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