category: Test, Measurement and Analytics

category: Auto, Security & Edge AI

Mapping The Impact Of Heat On Photonics
By Ed Sperling - 12 Feb, 2019 - Comments: 0

Heat and various types of noise can disrupt optical signals in silicon photonics applications, pushing light into frequencies that generally are filtered out. Unless those filters are adjusted, data may be lost or incomplete, and in the case of streaming data it may be impossible to reconstruct. But predicting when and how physical effects will affect light isn't always obvious, which makes ... » read more

Antenna Array Design for ADAS
By David Vye - 12 Feb, 2019 - Comments: 0

By Milton Lien and David Vye By implementing radar technology over the 76 to 81 GHz spectrum, advanced driver-assist systems (ADAS) enable smart vehicles with the ability to alert and assist drivers in a variety of functions, from low tire-pressure warning to collision avoidance to self-parking. These automotive radar applications use the millimeter-wave (mmWave) spectrum to exploit more ban... » read more

Failure Analysis of a Product—Not Only a Component
By DELTA, a part of FORCE Technology - 12 Feb, 2019 - Comments: 0

Classic failure analysis (FA) technique generally deals with a single failed component in a complete product to detect the root cause of failure. This approach is inexpensive and less time-consuming. However, this may end up with a wrong interpretation of the product failure or overlooking the synergetic effect of different components related to the failure. This article is about a product on ... » read more

Design of Phased-Array Antennas for MIMO & Beam-Steering Applications
By NI - 12 Feb, 2019 - Comments: 0

This white paper explores basic phased-array theory and the design considerations behind next-generation antenna systems. It examines the new capabilities recently added to the NI AWR Design Environment platform for developing the RF front-end hardware supporting these new antenna systems, which must be optimized for performance, reliability, compactness, and cost. Click here to read more. » read more

Reliability Becomes The Top Concern In Automotive
By SE Staff - 12 Feb, 2019 - Comments: 4

Reliability is emerging as the top priority across the hottest growth markets for semiconductors, including automotive, industrial and cloud-based computing. But instead of replacing chips every two to four years, some of those devices are expected to survive for up to 20 years, even with higher usage in sometimes extreme environmental conditions. This shift in priorities has broad ramificat... » read more

Testing AI Systems
By Ed Sperling - 15 Jan, 2019 - Comments: 0

AI is booming. It's coming to a device near you—maybe even inside of you. And AI will be used to design, manufacture and even ship those devices, regardless of what they are, where they are used, or how they are transported. The big questions now are whether these systems work, for how long—and what do those metrics even mean? An AI system, or AI-enhanced system, is supposed to adapt ove... » read more

Chasing Reliability In Automotive Electronics
By SE Staff - 15 Jan, 2019 - Comments: 0

Assuring reliability in automotive electronics has set off a scramble across the semiconductor supply chain and unearthed a list of issues for which there is insufficient data, a lack of well-defined standards, and inconsistent levels of expertise. Reliable functional safety that spans 18 to 20 years of service in harsh environments, or under constant use with autonomous taxis or trucks, is ... » read more

What AI Is… And Isn’t
By Terry Brewer - 15 Jan, 2019 - Comments: 0

AI is very good at some things. It may never be good at others. The challenge is figuring out where it can help the most, and then making the cost calculation for how it can be applied. Cost sounds like it should be fairly straightforward, but it isn't. For instance, what is the cost of continuing to doing something the same way if you aren't making necessary changes? Delaying those changes ... » read more

The Next Big Generation
By Judy Davies - 15 Jan, 2019 - Comments: 0

As members of the global semiconductor business, we are continually looking to identify the next big thing (NBT) that will drive market growth. Typically, we try to predict which new product – from smart vehicles to wearable electronics – will become the next mass-market item that will boost our industry into a successively higher orbit. Thanks to the innovators and visionaries among us, th... » read more

Using a Fault Insertion and Current Sensing Unit
By NI - 15 Jan, 2019 - Comments: 0

When testing embedded software on mission critical electronic control units, like those used in automobiles or aircraft, it is important to validate the behavior with external faults for example if the integrity of the signals to the controller are compromised. The SLSC-12251/2 products from NI are designed for this purpose, these modules can be inserted into the signal path between the data ac... » read more

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