Virtual Packages Improve Signal Integrity


The 112 Gb/s generation of SerDes has brought along excessive loss within the package, around 5 dBs of loss within each monolithic package. This loss markedly reduces the usefulness of these SerDes. MCM technology has progressed to where the use of 70mm packages is routine. Non-interposer MCMs easily can use 20 or more chiplets, plus large dies and passives can be used. These MCMs have low ... » read more

SerDes For Chiplets


The XSR 56G and 112G Interoperability Agreements (IAs) announced by the OIF are intended to cover a channel consisting of a pair of up to 50mm. The primary defined application of the XSR SerDes is connecting a chip to a “nearby” optical engine. Because the requirements on these channels are much less stringent than they are on long reach channels, XSR SerDes are expected to have lower power... » read more

Speedier, More Accurate Testing of Automotive Sensors Is Here


The amount of electronic content in automobiles continues to grow at a brisk pace, and sensors represent a significant percentage of cars’ electronics. MarketsandMarkets estimates that the automotive sensors market alone will reach US$36.42 billion in value by 2023, at a compound annual growth rate (CAGR) of 6.7 percent between 2017 and 2023. Sensors in cars are used to monitor and control... » read more

5G Test And Deployment


Advantest’s Adrian Kwan talks about 5G test, how it will change as the wireless technology evolves toward higher frequency signals, and what happens when many more users and backward compatibility are added to the network. https://youtu.be/x_-3yX7fWak » read more

Variability In Chip Manufacturing


Brewer Science’s Jim Korich talks about how to deal with variability in processes and why consistency in materials is so important at advanced nodes. https://youtu.be/U1KkUmtmqpE » read more

What is STS Software Bundle?


The STS Software Bundle provides all the software tools and hardware drivers you need to efficiently develop and deploy test programs, interactively debug, and maintain and calibrate the NI Semiconductor Test System (STS). NI will release new bundles regularly to incorporate new functionality and hardware drivers. The STS Software Bundle includes tools for interactive measurements and debugg... » read more

Why Test Costs Will Increase


The economics of test are under siege. Long seen as a necessary but rather mundane step in ensuring chip quality, or a way of testing circuitry from the inside while it is still in use, manufacturers and design teams have paid little attention to this part of the design-through-manufacturing flow. But problems have been building for some time in three separate areas, and they could have a b... » read more

Collaboration And Advanced Substrates


Discussions of semiconductor manufacturing tend to focus on CMOS logic and memory devices, sometimes to the exclusion of everything else. Discussions of silicon-on-insulator wafer markets focus on the needs of high performance logic. Lithography analysts emphasize high density memories. It’s easy to forget that real systems contain other devices, too. A modern smartphone probably supports ... » read more

Kandou’s Glasswing IP


Introduction The growing digitalization of our society has made our lives connected and, in many aspects, easier. But the digital revolution also implies that the total amount of data processed in the world is doubling every two years or so. Electronic devices such as mobile phones, laptops, satellites, servers or self-driving vehicles must cope with twice as much data, at higher speeds. Tradi... » read more

Lab-To-Fab Testing


Test equipment vendors are working on integrating testing and simulation in the lab with testing done later in the fab, setting the stage for what potentially could be the most significant change in semiconductor test in years. If they are successful, this could greatly simplify design for test, which has become increasingly difficult as chips get more complex, denser, and as more heterogene... » read more

← Older posts Newer posts →