category: Test, Measurement and Analytics

category: Auto, Security & Edge AI

An Inside Look At Testing’s Leading Edge
By Ed Sperling - 12 May, 2020 - Comments: 0

Mike Slessor, president and CEO of FormFactor, sat down with Semiconductor Engineering to discuss testing of AI and 5G chips, and why getting power into a chip for testing is becoming more difficult at each new node. SE: How does test change with AI chips, where you've got massive numbers of accelerators and processors developed at 7 and 5nm? Slessor: A lot of the AI stuff that we've been... » read more

Heating Up Cryogenic Wafer Testing
By Thomas Funke - 12 May, 2020 - Comments: 0

The use of on-wafer superconducting materials, other novel materials, and traditional semiconductors at cryogenic temperatures (below about 123K, or -150°C) has grown quickly in recent years. Inventive new sensors take advantage of unique material properties at very low temperatures to detect a wide variety of physical phenomena such as infrared radiation, magnetic fields, x-rays, and more. T... » read more

Reliability Monitoring Of GUC 7nm High-Bandwidth Memory (HBM) Subsystem
By proteanTecs - 27 Apr, 2020 - Comments: 0

This white paper presents the use of proteanTecs’ Proteus for HBM subsystem reliability based on deep data analytics and enhanced visibility, overcoming the limitations of advanced heterogeneous packaging. It will describe the operation concept and provide results from a GUC 7nm HBM Controller ASIC. A typical CoWoS chip has hundreds of thousands of micro-bumps (u-bumps). 3-8 u-bumps are us... » read more

Using Big Data For Yield And Reliability
By Ed Sperling - 22 Apr, 2020 - Comments: 0

John O’Donnell, CEO of yieldHUB, talks about the importance of clean data for traceability, yield improvement and device reliability, where and how it gets cleaned, and why that needs to be accompanied by domain expertise. » read more

NVM Reliability Challenges And Tradeoffs
By Bryon Moyer - 13 Apr, 2020 - Comments: 0

This second of two parts looks at different memories and possible solutions. Part one can be found here. While various NVM technologies, such as PCRAM, MRAM, ReRAM and NRAM share similar high-level traits, their physical renderings are quite different. That provides each with its own set of challenges and solutions. PCRAM has had a fraught history. Initially released by Samsung, Micron, a... » read more

Redefining Device Failures
By Ed Sperling - 07 Apr, 2020 - Comments: 0

Can a 5nm or 3nm chip really perform to spec over a couple decades? The answer is yes, but not using traditional approaches for designing, manufacturing or testing those chips. At the next few process nodes, all the workarounds and solutions that have been developed since 45nm don't necessarily apply. In the early finFET processes, for example, the new transistor structure provided a huge im... » read more

The Convergence Of Advanced Packaging And SMT
By Subodh Kulkarni - 07 Apr, 2020 - Comments: 0

One statement is almost always true in the electronics industry: smaller is better. The relentless demand for electronic systems that pack more computing power and functionality into less space has driven the development of new processes and designs since the invention of the integrated circuit. In recent years that drive has taken a new direction, literally, as manufacturers have discovered th... » read more

Inside The New Non-Volatile Memories
By Bryon Moyer - 07 Apr, 2020 - Comments: 0

The search continues for new non-volatile memories (NVMs) to challenge the existing incumbents, but before any technology can be accepted, it must be proven reliable. “Everyone is searching for a universal memory,” says TongSwan Pang, Fujitsu senior marketing manager. "Different technologies have different reliability challenges, and not all of them may be able to operate in automotive g... » read more

Lessons In Monitoring System Performance
By Tamar Naishlos - 07 Apr, 2020 - Comments: 0

At proteanTecs, we set out to revolutionize electronics with a breakthrough approach to address the challenges that come with scale: Deep Data monitoring of the health & performance of systems, from design to field. Knowledge and education are profoundly rooted in our core values. However, as the circumstances of COVID-19 unfold, we are following the guidelines of the World Health Organi... » read more

Benefits And Drawbacks Of Working From Home
By Marie Ryan - 07 Apr, 2020 - Comments: 0

Many people are working home in recent weeks, due to the current Coronavirus (Covid-19) crisis.  At yieldHUB, a good number of us have worked remotely or from a home office for years. We have people working like this in Taiwan, the USA, the UK and Ireland. As well as that, our software system enables semiconductor engineers and their managers to work remotely or from home. There are many be... » read more

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