tag: 2.5D

Different Economies Of Scale, And Lots Of Questions
By Ed Sperling - 12 Dec, 2013 - Comments: 0

Being able to shrink features and reach the next node is already an exclusive club. It will become more exclusive at 16/14nm, which is expected to hit volume production in 2015, and even more exclusive still at 10nm. In fact, it may begin to look like a semi-private affair. The argument being presented is that economies of scale will still exist for those companies with pockets deep enough ... » read more

Thermally Challenged
By Brian Bailey - 05 Dec, 2013 - Comments: 0

Chips run hot and the thermal densities increase with every reduction in fabrication geometry. “When we go down to 16nm the local power density increases by 25% and the local gate density also increases by 25% to 30%,” explains Norman Chang, vice president of product strategy at Ansys/Apache. In fact, this is becoming such a large problem that it is affecting the scaling process itsel... » read more

Seven Ways To Improve PPA Before Moving To FinFETs
By Ed Sperling - 05 Dec, 2013 - Comments: 0

Henry Ford wrote in his autobiography, “Any customer can have a car painted any color that he wants so long as it is black.” And for decades, the semiconductor industry has marched to a similar theme set by Moore’s Law. But with the transition to finFETs harder than it first appeared, questions are beginning to pop up that is fueling a new level of confusion. While the growing list of... » read more

Stacked Die Moves From Drawing Board To Reality
By Ed Sperling - 21 Nov, 2013 - Comments: 0

After decades of moving in a straight line from one process geometry shrink to the next, much of the semiconductor industry has taken a step back to figure out what comes next. While companies such as Intel, IBM and Samsung continue to look as far ahead as the 3nm process node, along with new materials to improve electron mobility and new transistor designs based on electron tunneling and carbo... » read more

Counting Pennies
By Ed Sperling - 21 Nov, 2013 - Comments: 0

Even Intel may not have enough cash on hand to pay for a new state-of-the-art fab at 7nm. With fully equipped fabs expected to rise into the plus-$10 billion range over the next few process nodes, and each new process shrink jam-packed with a multitude of new problems, the momentum for continuing to shrink features appears to be slowing down. Technically, it’s possible to shrink transistor... » read more

Tech Talk: 2.5D Stacked Die
By Ed Sperling - 20 Nov, 2013 - Comments: 0

What's the motivation for moving to 2.5D packaging and architectures rather than following Moore's Law? Shafy Eltoukhy, VP of operations and technology development at Open-Silicon, talks with Semiconductor Engineering about adding another dimension in semiconductors. [youtube vid=HwpY9bUNt0w] » read more

From DFM To IFM
By Ed Sperling - 14 Nov, 2013 - Comments: 0

For the past decade the bridge between design and manufacturing was called, appropriately enough, design for manufacturing. DFM tools, which by nature cross boundaries of what previously were discrete segments in the semiconductor flow, are now critical for complex designs. They allow design teams to check early in the design process whether chips will yield sufficiently and to incorporate rule... » read more

Momentum Builds For Monolithic 3D ICs
By Mark LaPedus - 14 Nov, 2013 - Comments: 1

The 2.5D/3D chip market is heating up on several fronts. On one front, stacked-die using through-silicon vias (TSVs) is taking root. In a separate area, Samsung is sampling the world’s first 3D NAND device, with Micron and SK Hynix expected to follow suit. And now, there is another technology generating steam—monolithic 3D integrated circuits. In stacked-die, bare die are connected using... » read more

Uncertainty Increases About What’s Next
By Ed Sperling - 24 Oct, 2013 - Comments: 0

Across the semiconductor industry, there is a lot of talk about what’s next. Lithography advances have stalled, NRE and mask costs are rising, and complexity is exploding. But unlike the 1 micron wall, which was supposed to be impenetrable, there is no single issue holding back progress. Instead, there are lots of them, most with pricey workarounds, but which together become more complicat... » read more

Front End Comes To The Back End
By Jeff Chappell - 19 Sep, 2013 - Comments: 0

By Jeff Chappell For outsourced assembly and test (OSAT) houses either planning for or already offering through-silicon via (TSV) capability for their 3D packaging efforts, this has meant the front end is coming to the back end, in a manner of speaking. A bit of an exaggeration perhaps, as most generalizations are. But thanks to TSVs, in a very real sense some of what would typically be the... » read more

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