Smart Test Collides With The Data Chain


Key Takeaways: The promise of smart test is a data-chain problem before it is an algorithm problem. A device can pass every checkpoint and still carry a latent defect the test record never captured. As test grows more adaptive, the validity of the measurement environment matters as much as the measurement itself. For years, the test roadmap has pointed toward more adaptive f... » read more

Securing Chiplet-Based Platforms: Distributed Trust With Centralized Authority


In previous blogs, From Monolithic SoCs to Chiplets: A New Hardware Security Paradigm, and Developing a Security Framework for Chiplet-based Systems, we discussed why chiplets change the game from a security perspective, and why security must be addressed at a platform-level in a chiplet-based system. In a monolithic device, trust is often implicitly bounded by the die itself: sensitive asse... » read more

How To Streamline Your Advanced Package Interconnect Designs


Monolithic system-on-chip (SoC) designs was once a popular choice. However, they face significant constraints in the era of AI. By forcing all chip functions into a single die and process node, they reduce engineering, manufacturing, and design cost flexibility. In contrast, the multi-die nature of chiplets enables different SoC functions to be designed and verified independently and fabrica... » read more

From Standards To Systems: The Chiplet Era On Arm


For three decades, Arm didn’t just participate in industry transformation — it redefined it. From mobile to cloud to automotive, Arm’s architecture and the AMBA ecosystem have become the backbone of scalable compute. Now the industry faces its next structural shift: The era of monolithic SoCs is tapering and giving way to the era of chiplet systems. While complex SoCs are going to b... » read more

Rethinking ESD Protection for System-On-Integrated Chiplets (UC Riverside)


A new technical paper, "In-SoIC ESD Protection for Chiplet-Based 3D Microsystems: Future Research Directions," was published by researchers at the University of California, Riverside. Abstract "Heterogeneous integration opens a pathway to three-dimensional chiplet-based microsystem chips. Electrostatic discharge reliability is a major challenge to future smart chips featuring rich functio... » read more

Mapping and Routing Fault-Tolerant Quantum Circuits Onto Chiplet Architectures (TU Munich)


A new technical paper, "Chipmunq: A Fault-Tolerant Compiler for Chiplet Quantum Architectures," was published by researchers at the Technical University of Munich. Abstract "As quantum computing advances toward fault-tolerance through quantum error correction, modular chiplet architectures have emerged to provide the massive qubit counts required while overcoming fabrication limits of mon... » read more

When Semiconductor Materials Misbehave


Key Takeaways Material behavior in production depends on the process context that no development environment can fully replicate. In advanced packaging, the interactions that cross domain boundaries are increasingly where failures originate. The most accurate materials data is also the most commercially sensitive, leaving simulation models calibrated against generic inputs rather tha... » read more

System-in-Package Challenges


Systems companies and leading-edge chipmakers are pushing past reticle limits with chiplet-based designs, often breaking compute-intensive functions into different chiplets and coupling those with other chiplets that may have been developed by different teams and at different process nodes. This is harder than it sounds, and results can vary widely even under the best circumstances. Nir Sever, ... » read more

Panel-Level Packaging’s Second Wave Meets Engineering Reality


Key Takeaways Panel-level packaging is arriving not because the engineering is ready, but because wafer-level economics are breaking down. Glass improves the warpage and dimensional stability problems of organic substrates but introduces a different class of failure modes that require materials solutions, not process adjustments. The central challenges of panel-level processing are m... » read more

Chiplet Standards Aim For Plug-n-Play


Key Takeaways Die-to-die chiplet standards are only the beginning. Many more standards are necessary for a chiplet marketplace. A number of such standards have either had initial versions released or are in progress. Existing work covers packaging, a system architecture, various design kits, a universal link layer, and updates to BoW. Today’s chiplets exist in silos. In a ... » read more

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