VIP: Behind The Velvet Rope


By Ann Steffora Mutschler Some years ago, as engineering teams began to incorporate more protocols into designs and as those protocols grew in sophistication and complexity in order to deliver additional performance, the verification task grew concurrently. At the same time, the design IP market was growing as complexity drove re-use of components, along with verification components—most com... » read more

Collaboration Grows


By Ed Sperling A series of recent announcements by the Big Three EDA vendors and their well-known partners from across the disaggregated SoC ecosystem is lending new credence to the impact of collaboration. While IDMs such as Apple, Intel, Samsung and IBM continue to blaze their own trail, developing in-house tools, methodologies, processes and chips, fabless companies working with foundrie... » read more

Experts At The Table: Mobile Design Challenges


By Ed Sperling Low-Power Engineering sat down to discuss the increasing challenges of designing for mobile devices with Qi Wang, technical marketing group director at Cadence; Cary Chin, director of technical marketing for low-power solutions at Synopsys; Bernard Murphy, CTO of Atrenta; and Dave Reed, senior director of marketing at SpringSoft. What follows are excerpts of that conversation. ... » read more

Redefining Systems Around Power


By Ed Sperling Engineers have been talking about system-level power budgets since Moore’s Law reached 65nm, but as power becomes a critical element of any design with or without a plug the definition of what constitutes a system is changing. While most SoC engineers think of the system as an IC, power increasingly is playing a significant role in the subsystem, and even in the larger syst... » read more

Power Intent Formats: Power Domain


By Luke Lang Starting this month, I will be writing a series of blogs inspired by “Dueling Power Formats”. The article correctly points out that there are currently three power formats: CPF, UPF 1.0, and IEEE 1801. Some designers will find themselves in a position of having to choose a format. Others will need to work with both formats. Regardless of which position one is in, these LP desi... » read more

Experts At The Table: Mobile Design Challenges


By Ed Sperling Low-Power Engineering sat down to discuss the increasing challenges of designing for mobile devices with Qi Wang, technical marketing group director at Cadence; Cary Chin, director of technical marketing for low-power solutions at Synopsys; Bernard Murphy, CTO of Atrenta; and Dave Reed, senior director of marketing at SpringSoft. What follows are excerpts of that conversation. ... » read more

Solid Verification Methodology Essential To Productivity


Verifying SoCs from a functional perspective pushes the limits of already lean resources, driving verification teams to seek out new ways to improve productivity of verification tasks. Of course, with the verification task being a time-bound one, the challenge is daunting. It is well understood that consumer electronics is pushing the technology envelope in terms of the amount of technology ... » read more

20nm IP Portability Appears Virtually Impossible


By Ann Steffora Mutschler Each node on the deep submicron path has brought new challenges to engineering teams, and 20nm is no different. With EUV (extreme ultraviolet) lithography challenges still being worked out, double patterning (DP) instead will be embraced in the manufacturing process most likely until 10nm. Due to the unique nature of DP, IP portability between foundries will become a ... » read more

Ripple Effects Through Value Chains


By Frank Schirrmeister This is the inaugural post for “Frankly Speaking,” a blog focused on embedded software and system-level design technologies, their adoption as technology themselves and how they enable technology adoption in the end markets. Tracking adoption and understanding its dynamics has been a passion of mine ever since I went to engineering school. After developing lots of... » read more

DFT: Essential For Power-Aware Test


By Ann Steffora Mutschler Power-aware test is a major manufacturing consideration due to the problems of increased power dissipation in various test modes, as well as test implications that come up with the usage of various low-power design technologies. Challenges for test engineers and test tool developers include understanding the various concerns associated with power-aware test, develo... » read more

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