tag: Siemens EDA

Impact Of GAA Transistors At 3/2nm
By Brian Bailey - 16 Aug, 2021 - Comments: 2

The chip industry is poised for another change in transistor structure as gate-all-around (GAA) FETs replace finFETs at 3nm and below, creating a new set of challenges for design teams that will need to be fully understood and addressed. GAA FETs are considered an evolutionary step from finFETs, but the impact on design flows and tools is still expected to be significant. GAA FETs will offer... » read more

Now You Can Automate Latch-Up Verification For 2.5/3D Technologies
By Dina Medhat - 12 Aug, 2021 - Comments: 0

Latch-up is modeled as a short circuit (low-impedance path) that can occur in an integrated circuit (IC). It may lead to destruction due to over-current resulting from interactions between parasitic devices (PNP and NPN). To protect against latch-up conditions, there are two key types of latch-up design rules—fundamental and advanced [1,2]. Fundamental rules are the local latch-up design r... » read more

Lowering Energy Per Bit
By Ann Mutschler - 12 Aug, 2021 - Comments: 0

Energy is emerging as a focal point in chip and system design, but solving energy-related issues needs to be dealt with on a much broader scale than design teams typically see. Energy is the amount of power consumed over a period of time to perform a given task, but reducing energy is a lot different than reducing power. It affects everything from operational costs and system performance to ... » read more

Adding Circuit Aging To Variability
By Brian Bailey - 12 Aug, 2021 - Comments: 0

Moving to a smaller node usually means another factor becomes important. The industry has become accustomed to doing process, temperature, voltage (PVT) corner analysis, but now it has to add aging into that mix. The problem is that planning for circuit aging is no longer a purely statistical process. Aging is dependent on activity over the lifetime of the device. Tools need to be modified a... » read more

2.5D And 3D-IC Latch-Up Prevention
By Siemens EDA - 11 Aug, 2021 - Comments: 0

2.5D/3D ICs have evolved into an innovative solution for many design and integration situations, but they present unique verification obstacles that challenge electronic design automation (EDA) tools originally designed for 2D ICs. Automated solutions are needed not only to reduce verification cycles but also to improve the quality and reliability of package designs. Automated verification o... » read more

Blog Review: Aug. 11
By Jesse Allen - 11 Aug, 2021 - Comments: 0

Arm's Rahul Mathur finds that traditional interconnects have become a bottleneck for improving IC performance and suggests buried interconnects as a way to lower signal routing delay. Cadence's Paul McLellan checks out forksheet FETs, a new transistor type that could allow scaling past 3nm, and the interconnect advances that will need to accompany it. A Synopsys writer explains the new LP... » read more

Designing Chips For Test Data
By Ed Sperling - 10 Aug, 2021 - Comments: 0

Collecting data to determine the health of a chip throughout its lifecycle is becoming necessary as chips are used in more critical applications, but being able to access that data isn't always so simple. It requires moving signals through a complex, sometimes unpredictable, and often hostile environment, which is a daunting challenge under the best of conditions. There is a growing sense of... » read more

Harness System-Level Data To Optimize Many-Core AI And ML Chips
By Siemens EDA - 10 Aug, 2021 - Comments: 0

The novel multicore architectures of SoCs for machine learning (ML) and artificial intelligence (AI) applications are expected to deliver huge improvements in power efficiency. However, chip development teams and the customers for their devices face the growing complexity of hardware-software co-optimization, validation, and debug. In short, these SoCs are increasingly difficult to validate and... » read more

Better Optimization For Many-Core AI Chips
By Richard Oxland - 10 Aug, 2021 - Comments: 0

The rise of massively parallel computing has led to an explosion of silicon complexity, driven by the need to process data for artificial intelligence (AI) and machine learning (ML) applications. This complexity is seen in designs like the Cerebras Wafer Scale Engine (figure 1), a tiled manycore, multiple wafer die with a transistor count into the trillions and nearly a million compute cores. ... » read more

Who Owns In-Chip Monitoring Data?
By Bryon Moyer - 10 Aug, 2021 - Comments: 1

In-chip monitors provide unprecedented visibility into the inner workings of complex integrated circuits for everything from process control to fine binning, preventive system maintenance, and failure analysis. But there may be many consumers of different slices of the data at very different phases of the chip lifecycle, raising questions about who controls and owns all of that data. The ans... » read more

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