Researchers from Arizona State University and Georgia Institute of Technology published “Thermal- and Aging-Aware Rowhammer Vulnerability Analysis of Monolithically-Integrated IWO eDRAM for Edge Platforms”.
“This work presents the first comprehensive temperature- and aging-aware vulnerability analysis of amorphous Indium Tungsten Oxide (IWO) embedded DRAM (eDRAM), a promising next-generation memory for monolithic 3D (M3D) integration,” per the paper’s abstract.
Find the technical paper here. May 2026.
Eduardo Ortega, Jungyoun Kwak, Shimeng Yu, and krishnendu chakrabarty. 2026. Thermal- and Aging-Aware Rowhammer Vulnerability Analysis of Monolithically-Integrated IWO eDRAM for Edge Platforms. J. Emerg. Technol. Comput. Syst. Just Accepted (May 2026). https://doi.org/10.1145/3819813

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