Memory at extreme temps; CXL to optimize bandwidth; partitioned security monitoring; impact of aging on clock tree design; materials beyond Si; 98 HW security failures; etching on diamond surfaces; dedoping in wafer-scale MoS2 films.
New technical papers recently added to Semiconductor Engineering’s library:
| Technical Paper | Research Organizations |
|---|---|
| Nonvolatile electrochemical memory at 600°C enabled by composition phase separation | University of Michigan and Sandia National Labs |
| Optimizing System Memory Bandwidth with Micron CXL Memory Expansion Modules on Intel Xeon 6 Processors | Micron and Intel |
| Interstellar: Fully Partitioned and Efficient Security Monitoring Hardware Near a Processor Core for Protecting Systems against Attacks on Privileged Software | KAIST |
| The Impact of Asymmetric Transistor Aging on Clock Tree Design Considerations | Israel Institute of Technology and The Hebrew University of Jerusalem |
| Future materials for beyond Si integrated circuits: a Perspective | Texas Instruments, AIXTRON SE and imec |
| Spatially Precise Light-Activated Dedoping in Wafer-Scale MoS2 Films | National Renewable Energy Laboratory (NREL) and Renewable & Sustainable Energy Institute |
| Hardware Security Failure Scenarios: Potential Hardware Weaknesses | NIST |
| The effects of sub-monolayer laser etching on the chemical and electrical properties of the (100) diamond surface | Macquarie University and MIT |
Find all technical papers here.
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