Multi-GPU traffic modeling; physical neural computing; RISC-V fault injection; automotive CAN timing analysis; EUV source optimization; lithography defect detection; dual-beam EUV efficiency.
New technical papers recently added to Semiconductor Engineering’s library:
| Technical Paper | Research Organizations |
|---|---|
| Eidola: Modeling Multi-GPU Network Communication Traffic in Distributed AI Workloads 🔗 | University of Wisconsin-Madison, AMD |
| Beyond Silicon: Materials, Mechanisms, and Methods for Physical Neural Computing 🔗 | University of Lübeck, TU Hamburg |
| InjectV: Modeling Fault Injection Attacks in RISC-V Simulation Environment 🔗 | Politecnico di Torino, CEA-List |
| A Cross-Validated DSPN and Worst-Case Response-Time Framework for Timing Analysis of Automotive CAN Networks 🔗 | National Yang Ming Chiao Tung University, Chung Yuan Christian University |
| Optimization of EUV output by experimentally validated radiation-hydrodynamic simulations across a broad laser parameter space 🔗 | The University of Osaka, National Institute for Fusion Science, National Institutes for Quantum Science and Technology, Osaka Metropolitan University |
| Failure-Aware Refinement of Vision-Language Model for Lithography Defect Detection 🔗 | Hanyang University, Korea University, Korea Institute of Industrial Technology |
| 40% boost in extreme ultraviolet conversion efficiency via simultaneous dual-beam 2-µm laser irradiation 🔗 | Utsunomiya University, RIKEN, The University of Tokyo, Tohoku University |
Find more semiconductor research papers here.
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