tag: electromigration

Electromigration Analysis At Advanced Nodes
By Valeriy Sukharev - 11 Jul, 2013 - Comments: 0

Introduction Continuous downward scaling is challenging electromigration (EM) signoff using traditional EM checking approaches. The size reduction of metal line cross sections results in higher current densities, which are governed by technology scaling. With the transition to advanced technological nodes, the widely-predicted decrease in EM lifetime is responsible for the pessimistic performa... » read more

New Reliability Issues Emerge
By Ed Sperling - 27 Jun, 2013 - Comments: 0

By Ed Sperling Most consumers define reliability by whether a device turns on and works as planned, but the term is becoming harder to define as complexity increases and systems are interconnected. Adding more functionality in less space has made it more difficult to build complex chips, and it has made it more difficult to prevent problems in those chips. Verification coverage is a persist... » read more

Experts At The Table: The Growing Signoff Headache
By Ed Sperling - 07 Jun, 2013 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down to discuss signoff issues with Rob Aitken, an ARM fellow; Sumbal Rafiq, director of engineering at Applied Micro; Ruben Molina, product marketing director for timing signoff at Cadence; Carey Robertson, director of product marketing for Calibre extraction at Mentor Graphics; and Robert Hoogenstryd, director of marketing for design ... » read more

Bringing Electrical Info To Design’s Forefront
By Ann Mutschler - 09 May, 2013 - Comments: 0

By Ann Steffora Mutschler To reflect the impact on transistors of smaller process nodes and the electrical effects that occur as a result, a shift is underway where the electrical analysis and verification that used to be done when the layout was complete is moving earlier in the design process. The analysis includes parasitic extraction of interconnect and device parasitics, electromigrati... » read more

Executive Briefing: Andrew Yang
By Ed Sperling - 09 May, 2013 - Comments: 0

By Ed Sperling Andrew Yang, president of ANSYS subsidiary Apache Design, sat down with Low-Power/High-Performance Engineering to talk about why power is becoming so important and where the future challenges lie. What follows are excerpts of that conversation. LPHP: What’s the most important issue these days for chipmakers? Yang: According to the feedback we’ve gotten from our customer... » read more

Experts At The Table: FinFET Questions And Issues
By Ed Sperling - 11 Apr, 2013 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down to discuss the current state and future promise of finFETs, and the myriad challenges, with Ruggero Castagnetti, an LSI fellow; Barry Pangrle, senior power methodology engineer at Nvidia; Steve Carlson, group director of marketing at Cadence; and Mary Ann White, director of product marketing at Synopsys. What follows are excerpts ... » read more

Good Times For Analog Designers
By Ann Mutschler - 14 Feb, 2013 - Comments: 1

By Ann Steffora Mutschler For a number of technological reasons, analog/mixed-signal design and low-power design are converging, and with that comes both challenges and opportunities. As far as challenges go, process variations at 14nm, 20nm and even 28nm have increased significantly to include DFM impacts such as layout-delay effects. On the digital side, those process changes affect... » read more

Capping Tools Tame Electromigration
By Mark LaPedus - 31 Jul, 2012 - Comments: 0

By Mark LaPedus The shift towards the 28nm node and beyond has put the spotlight back on the interconnect in semiconductor manufacturing. In chip scaling, the big problem in the interconnect is resistance-capacitance (RC). Another, and sometimes forgotten, issue is electromigration. “Electromigration gets worse in device scaling,” said Daniel Edelstein, an IBM Fellow and manager of BE... » read more

Routing Congestion Returns
By Ed Sperling - 26 Jul, 2012 - Comments: 0

By Ed Sperling Routing congestion has returned with a vengeance to SoC design, fueled by the advent of more third-party IP, more memory, a variety of new features, as well as the inability to scale wires at the same rate as transistors. This is certainly not a foreign concept for IC design. The markets for place and route tools were driven largely by the need to automate this kind of operat... » read more

Experts At The Table: Pain Points
By Ed Sperling - 12 Jul, 2012 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down with Vinod Kariat, a Cadence fellow; Premal Buch, vice president of software engineering at Altera; Vic Kulkarni, general manager of Apache Design; Bernard Murphy, CTO at Atrenta, and Laurent Moll, CTO at Arteris. What follows are excerpts of that conversation. LPHP: Where will the pain points be going forward? Kariat: 20nm is... » read more

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