category: Test, Measurement and Analytics

category: Auto, Security & Edge AI

Better Inspection, Higher Yield
By Bryon Moyer - 08 Sep, 2020 - Comments: 0

Wafers can be inspected for large, obvious defects, or for small, subtle ones. The former is referred to as macro-inspection, while the latter is micro-inspection. These processes use different machines with different capital and operating costs, and they might look like competing approaches with different economic returns. In fact, they are complementary tactics that can be balanced within an ... » read more

18 Things Fabless Start-Ups Should Look For In A Yield Management System
By yieldHUB - 08 Sep, 2020 - Comments: 0

Do you work for a fabless start-up? Are you ramping up? If so, you need data-analysis tools for your production data. You will struggle without them. You have two options for yield management analysis. You may decide to hire an engineer (or team of engineers) whose job it is to transfer the data from datalogs to a spreadsheet. Then generate reports. Or, you could invest in a system that takes c... » read more

Far Out AI In Remote Locations
By SE Staff - 08 Sep, 2020 - Comments: 0

There really isn’t anything that you can do on Earth with electronics that you can’t do in space, but it certainly can be a lot harder and take longer to fix is something goes wrong. And as more intelligent electronics are launched into space, the concern over potential failures is growing. AI inferencing has been pushing out further for some time, and it is starting to redefine what con... » read more

NanoResolution MRS Sensor: Fast, Precise 3D Inspection And Measurement for Advanced Semiconductor Packaging Applications
By CyberOptics - 08 Sep, 2020 - Comments: 0

The semiconductor packaging industry continues to advance, with new designs adding more layers, finer features and more I/O channels to achieve faster connections, higher bandwidth and lower power consumption. As packaging technologies have evolved, manufacturers have adapted old processes and adopted new processes to connect chips to each other and to the outside world. Often these new process... » read more

Silicon Photonics: Automated Wafer-Level Probing And Silicon Photonics
By FormFactor - 08 Sep, 2020 - Comments: 0

As chip designers are pressed for ever-increasing data rates, the use of wavelength-division multiplexing (WDM) with infrared photonic signals as a data transfer medium is increasingly finding its way into CMOS silicon-based devices. Termed “silicon photonics” (SiPh), this technology is not only being used to displace traditional electrical interconnects, but also for a broad range of appli... » read more

Early And Fine Virtual Binning
By Noam Brousard - 08 Sep, 2020 - Comments: 0

Not all chips are created equal, and this is viewed as both a blessing and a curse by semiconductor makers. On one hand, chips can be screened for certain attributes, and some of the chips can be sold for higher prices than others. On the other hand, variations in the production process cause silicon performance to greatly differ, leaving chip makers with a wide and somewhat unpredictable distr... » read more

Chiplet Reliability Challenges Ahead
By Ed Sperling - 12 Aug, 2020 - Comments: 2

Assembling chips using LEGO-like hard IP is finally beginning to take root, more than two decades after it was first proposed, holding the promise of faster time to market with predictable results and higher yield. But as these systems of chips begin showing up in mission-critical and safety-critical applications, ensuring reliability is proving to be stubbornly difficult. The main driver fo... » read more

The Very Long Road To Autonomous Vehicles
By Ed Sperling - 11 Aug, 2020 - Comments: 0

It may be a long wait before fully autonomous vehicles hit the road. Even semi-autonomous vehicles aren't doing so well. The American Automobile Association drove 4,000 miles in cars equipped with active driver assistance, averaging problems every 8 miles. AAA cited a host of problems, including driving too close to other cars or guardrails, aggressive braking, and automated steering that wo... » read more

Better Analytics Needed For Assembly
By Anne Meixner - 11 Aug, 2020 - Comments: 0

Package equipment sensors, newer inspection techniques, and analytics enable quality and yield improvement, but all of those will require a bigger investment on the part of assembly houses. That's easier said than done. Assembly operations long have operated on thin profit margins because their tasks were considered easy to manage. Much has changed over the past several years, however. The r... » read more

Fleet Management Of Data Center Electronics
By Yuval Bonen - 11 Aug, 2020 - Comments: 0

Data has become the most valuable resource of our time, with processing, storage and networking being the key assets of the modern digital world. This has fueled a two-decade spread of massive data centers around the globe and a surge in the cloud services they offer people, corporations, and countries alike. New services like video, game streaming, AI and social media push the need for data... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2026 SMG   |  Terms of Service  |  Privacy Policy