5nm SRAM minimum supply voltage; particle-induced mask diffraction on EUV lithography; chiplet placement and routing; HW-based heterogeneous memory management for LLM inference; real-world HW security attacks; controlled shared memory isolation; digital twins for vehicular prototyping.
New technical papers recently added to Semiconductor Engineering’s library:
| Technical Paper | Research Organizations |
|---|---|
| An Investigation of Minimum Supply Voltage of 5nm SRAM from 300K down to 10K | Indian Institute of Tech., UC Berkeley and Munich Institute of Robotics and Machine Intelligence |
| Impact of Sn Particle-Induced Mask Diffraction on EUV Lithography Performance Across Different Pattern Types | Hanyang University and Paul Scherrer Institute |
| Advanced Chiplet Placement and Routing Optimization considering Signal Integrity | KAIST |
| Hardware-based Heterogeneous Memory Management for Large Language Model Inference | KAIST and Stanford University |
| The Pains of Hardware Security: An Assessment Model of Real-World Hardware Security Attacks | TU Wien and TÜV Austria |
| Controlled Shared Memory (COSM) Isolation: Design and Testbed Evaluation | Arizona State University and Intel Corporation |
| Digital Twin Technologies for Vehicular Prototyping: A Survey | Central Michigan University and University of Florida |
Find more semiconductor research papers here.
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