AFMTJs for IMC; test generation w/high functional switching activities; Cu-to-Cu bonding; high-clockrate free-space IMC; information flow verification; YOLO advances; ultrafast visual perception beyond human capabilities; 3D printing of nanomaterials-based electronics.
New technical papers recently added to Semiconductor Engineering’s library:
| Technical Paper | Research Organizations |
|---|---|
| AFMTJs for In-Memory Computing: Modeling and Case Study | University of Arizona |
| Test Generation for Subcircuits with High Functional Switching Activities | Purdue University |
| High-clockrate free-space optical in-memory computing | UC Berkeley, USC, and TU Berlin |
| Hybrid surface pre-treatments for enhancing copper-to-copper direct bonding | National Chung Hsing University and Osaka University |
| IFV: Information Flow Verification at the Pre-silicon Stage Utilizing Static-Formal Methodology | University of Florida |
| Advances in You Only Look Once (YOLO) algorithms for lane and object detection in autonomous vehicles | RMIT et al. |
| Ultrafast visual perception beyond human capabilities enabled by motion analysis using synaptic transistors | Beihang University, BIT, KAUST, Cambridge et al. |
| Three-dimensional printing of nanomaterials-based electronics with a metamaterial-inspired near-field electromagnetic structure | Rice University, University of Utah, NUS |
Find more semiconductor research papers here.
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