Processing-using-DRAM interference; atomic-scale plasma processing; gallium oxide phase instability; event-driven reinforcement learning for fab control; microarchitectural timing leaks in embedded processors; LLM-assisted RTL generation; TPU training supercomputers.
New technical papers recently added to Semiconductor Engineering’s library:
| Technical Paper | Research Organizations |
|---|---|
| PuDGhost: Experimental Analysis of Computation Result Corruption in Processing-using-DRAM Operations on Real DRAM Chips and Implications for Future Systems 🔗 | The University of Tokyo, ETH Zurich, CISPA, RIKEN |
| Recent Progress in Atomic-Scale Controlled Plasma Processing 🔗 | Nagoya University, Boise State University, Korea Institute of Fusion Energy, Hitachi High-Tech Corp., Princeton Plasma Physics Laboratory |
| Coordination-Sensitive Nanoscale Analysis of Defect-Driven Phase Transformation in Si-Doped Gallium Oxide 🔗 | University at Buffalo, The Ohio State University, Lawrence Livermore National Laboratory |
| Event-Driven Reinforcement Learning Enables Long-Horizon Control in Semiconductor Fabrication 🔗 | Politecnico di Milano, STMicroelectronics |
| MIPSBLEED: Uncovering Microarchitectural Timing Leaks in Pervasive Embedded Processors 🔗 | Rochester Institute of Technology |
| LLM4RTL: Tool-Assisted LLM for RTL Generation 🔗 | UC Riverside, Futurewei |
| Google’s Training Supercomputers from TPU v2 to Ironwood: Architectural Stability, Scale, Resilience, Power Efficiency, and Sustainability Across Five Generations 🔗 | Google, UC Berkeley |
Find more semiconductor research papers here.
Leave a Reply