Chip Industry Technical Paper Roundup: Nov. 18

Shrinking interconnects beyond copper; CFET, NSFET architecture comparative analysis; defractive processors; monolithic 3D stackable 1T1C DRAM; imaging buried interfaces in twisted oxide moirés; 3D-stacked chiplets LLM inference accelerator; lateral semiconductor–free-space gate transistors.

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New technical papers recently added to Semiconductor Engineering’s library:

Technical Paper Research Organizations
Shrinking interconnects beyond copper Florida State Univ., Cornell
Impact of Aging, Self-Heating, and Parasitics Effects on NSFET and CFET TU Munich, IIT Kanpur
Massively parallel and universal approximation of nonlinear functions using diffractive processors UCLA
Row Hammer Effect and Floating Body Effect of Monolithic 3D Stackable 1T1C DRAM Georgia Tech
Mind the Gap — Imaging Buried Interfaces in Twisted Oxide Moirés Cornell, SLAC, Stanford, USC, NC State Univ., Univ. of Chicago, USC, Institute for Basic Science, POSTECH
PICNIC: Silicon Photonic Interconnected Chiplets with Computational Network and In-memory Computing for LLM Inference Acceleration National University of Singapore
Lateral Semiconductor–Free-Space Gate Transistors KAUST, Indian Institute of Technology

Find more semiconductor research papers here.



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